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Titolo:
Precise surface resistance measurements of YBa2Cu3Oy films with the dielectric resonator method
Autore:
Obara, H; Kosaka, S; Sawa, A; Yamasaki, H; Kobayashi, Y; Hashimoto, T; Ohshima, S; Kusunoki, M; Inadomaru, M;
Indirizzi:
Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan Electrotech Lab Tsukuba Ibaraki Japan 3058568 uba, Ibaraki 3058568, Japan Saitama Univ, Dept Elect & Elect Engn, Urawa, Saitama 3388570, Japan Saitama Univ Urawa Saitama Japan 3388570 n, Urawa, Saitama 3388570, Japan Yamagata Univ, Fac Engn, Yonezawa, Yamagata 9928510, Japan Yamagata Univ Yonezawa Yamagata Japan 9928510 wa, Yamagata 9928510, Japan
Titolo Testata:
PHYSICA C
, volume: 357, anno: 2001,
parte:, 2
pagine: 1511 - 1515
SICI:
0921-4534(200108)357:<1511:PSRMOY>2.0.ZU;2-5
Fonte:
ISI
Lingua:
ENG
Soggetto:
MICROWAVE;
Keywords:
microwave surface resistance; high-T-c film; standardization;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
4
Recensione:
Indirizzi per estratti:
Indirizzo: Obara, H Electrotech Lab, 1-1-4 Umezono, Tsukuba, Ibaraki 3058568, Japan Electrotech Lab 1-1-4 Umezono Tsukuba Ibaraki Japan 3058568 Japan
Citazione:
H. Obara et al., "Precise surface resistance measurements of YBa2Cu3Oy films with the dielectric resonator method", PHYSICA C, 357, 2001, pp. 1511-1515

Abstract

The surface resistance of high-T-c superconducting films at microwave frequencies was carefully measured by the dielectric resonator method using twosapphire rods. The dielectric resonator method is appropriate for the standard measurement of surface resistance at microwave frequencies. In the present work, we focused on asymmetry in coupling and the parasitic coupling effect which cause error in this method and discussed the precision and accuracy of the measurements. Finally, we report on a round robin test in whichthe observed surface resistances in three institutes gave good agreement. These results were reflected in the working draft of the International Electrotechnical Commission Technical Committee 90 (IEC/TC90). (C) 2001 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 03/04/20 alle ore 04:25:22