Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Derivation of pair distribution functions for interface interdiffusion analysis for multilayered thin films using high-energy electron diffraction
Autore:
Brunner, W; Attenberger, W; Hoffmann, H; Zweck, J;
Indirizzi:
Univ Regensburg, Inst Angew Phys, D-93040 Regensburg, Germany Univ Regensburg Regensburg Germany D-93040 , D-93040 Regensburg, Germany
Titolo Testata:
JOURNAL OF PHYSICS-CONDENSED MATTER
fascicolo: 13, volume: 13, anno: 2001,
pagine: 2865 - 2873
SICI:
0953-8984(20010402)13:13<2865:DOPDFF>2.0.ZU;2-9
Fonte:
ISI
Lingua:
ENG
Soggetto:
SCATTERING;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
6
Recensione:
Indirizzi per estratti:
Indirizzo: Brunner, W Univ Regensburg, Inst Angew Phys, D-93040 Regensburg, Germany Univ Regensburg Regensburg Germany D-93040 egensburg, Germany
Citazione:
W. Brunner et al., "Derivation of pair distribution functions for interface interdiffusion analysis for multilayered thin films using high-energy electron diffraction", J PHYS-COND, 13(13), 2001, pp. 2865-2873

Abstract

High-energy electron diffraction has been used to obtain reduced density functions from multilayered thin films. Due to the very nature of the experiment, only interatomic correlations perpendicular to the incoming electron beam are responsible for the scattered intensity. This allows an investigation of the interface interdiffusion of inner surfaces. Since no specimen preparation is needed, the technique is uninfluenced by preparation artefacts. We describe the theory and the experimental requirements for the application of this method and present results obtained for a terbium/iron multilayer film.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/09/20 alle ore 20:12:41