Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties
Autore:
Hinojosa, J;
Indirizzi:
Univ Politecn Cartagena, Dept Elect Tecnol Comp & Proyectos, Murcia 30203,Spain Univ Politecn Cartagena Murcia Spain 30203 Proyectos, Murcia 30203,Spain
Titolo Testata:
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
fascicolo: 2, volume: 11, anno: 2001,
pagine: 80 - 82
SICI:
1531-1309(200102)11:2<80:SBMOAF>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
PERMITTIVITY;
Keywords:
broadband measurement; coplanar; permeability; permittivity; propagation; S-parameters;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
--discip_EC--
Citazioni:
7
Recensione:
Indirizzi per estratti:
Indirizzo: Hinojosa, J Univ Politecn Cartagena, Dept Elect Tecnol Comp & Proyectos, Campus Muralla del Mar, Murcia 30203, Spain Univ Politecn Cartagena Campus Muralla del Mar Murcia Spain 30203
Citazione:
J. Hinojosa, "S-parameter broadband measurements on-coplanar and fast extraction of the substrate intrinsic properties", IEEE MICR W, 11(2), 2001, pp. 80-82

Abstract

A broadband technique for determining the electromagnetic properties of isotropic thin-film materials, which uses a coplanar line, is presented. Complex permittivity and permeability are computed from S-parameter measurements of a coplanar cell propagating the dominant mode. Measured epsilon (r) and mu (r) data for several materials are presented between 0.05 GHz and 40 GHz, This technique shows a good agreement between measured and predicted data.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 31/03/20 alle ore 09:52:41