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Titolo:
Structural analysis of organic interfacial layers by ellipsometry
Autore:
Keddie, JL;
Indirizzi:
Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England Univ Surrey Guildford Surrey England GU2 7XH ord GU2 7XH, Surrey, England
Titolo Testata:
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE
fascicolo: 2, volume: 6, anno: 2001,
pagine: 102 - 110
SICI:
1359-0294(200104)6:2<102:SAOOIL>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Soggetto:
AIR-WATER-INTERFACE; INFRARED SPECTROSCOPIC ELLIPSOMETRY; NONIONIC SURFACTANTS; PROTEIN ADSORPTION; BETA-CASEIN; SOLID/LIQUID INTERFACE; OVERFLOWING CYLINDER; NEUTRON REFLECTION; DIBLOCK COPOLYMERS; OPTICAL TECHNIQUES;
Keywords:
ellipsometry; adsorption; reflectivity; thin films; data inversion; surface excess; solution ambiguity; surfaces; interfaces; polymers; surfactants; critical phenomena;
Tipo documento:
Review
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
60
Recensione:
Indirizzi per estratti:
Indirizzo: Keddie, JL Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England UnivSurrey Guildford Surrey England GU2 7XH , Surrey, England
Citazione:
J.L. Keddie, "Structural analysis of organic interfacial layers by ellipsometry", CURR OP COL, 6(2), 2001, pp. 102-110

Abstract

Ellipsometry has 'come of age' as a technique for the analysis of problemsrelated to colloid and interface science. It has advanced far beyond applications of measuring film thickness or optical constants - although these remain important uses. Studies of the structure of polymers at the solid/liquid interface have been advanced significantly by the realisation of Fourier transform ellipsometry. Another important achievement has been the calibrated measurement of the dynamic surface excess at the flowing surface of a liquid jet. The uses of ellipsometry to study critical adsorption in binaryliquids and to measure the width of liquid/liquid interfaces are also noteworthy. An important development is the use of infrared - rather than visible - light, which opens up numerous possibilities for the simultaneous structural and chemical interrogation of interfaces non-invasively. (C) 2001 Elsevier Science Ltd. Al rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 19/09/20 alle ore 21:58:27