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Titolo:
Relative secondary ion yields of polymers
Autore:
Dong, X; Hercules, DM;
Indirizzi:
Vanderbilt Univ, Dept Chem, Stn B, Nashville, TN 37235 USA Vanderbilt Univ Nashville TN USA 37235 em, Stn B, Nashville, TN 37235 USA
Titolo Testata:
JOURNAL OF PHYSICAL CHEMISTRY B
fascicolo: 18, volume: 105, anno: 2001,
pagine: 3942 - 3949
SICI:
1520-6106(20010510)105:18<3942:RSIYOP>2.0.ZU;2-H
Fonte:
ISI
Lingua:
ENG
Soggetto:
LASER-DESORPTION IONIZATION; FLIGHT MASS-SPECTROMETRY; STRUCTURAL CHARACTERIZATION; SYNTHETIC-POLYMERS; TIME; POLYMERIZATION; METHACRYLATE); PERFORMANCE; FILMS; SIMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
32
Recensione:
Indirizzi per estratti:
Indirizzo: Hercules, DM Vanderbilt Univ, Dept Chem, Stn B, Box 1822, Nashville, TN 37235 USA Vanderbilt Univ Box 1822 Nashville TN USA 37235 TN 37235 USA
Citazione:
X. Dong e D.M. Hercules, "Relative secondary ion yields of polymers", J PHYS CH B, 105(18), 2001, pp. 3942-3949

Abstract

A method has been developed to measure the relative secondary ion yields of polymers. Parameters affecting secondary ion yield include primary ion current, detector efficiency, mole concentrations of oligomers, and the extent of oligomer fragmentation. All of these factors are considered in the measurement protocol. Two specific homopolymers were investigated: poly(dimethylsiloxane) and poly(methylphenylsiloxane). The relative secondary ion yields measured for PMPhS/PDMS were in the range of 0.29-0.35, depending on thepolymer ratio. Transformation probabilities also were measured for the twopolymers, and the PMPhS/PDMS ratio was 0.57. The results of the study indicate that the pendant groups on the siloxane side chain have a significant effect on polymer ion yield and that measurement of relative ion yields forpolymer mixtures represents a valid yield comparison.

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Documento generato il 19/09/20 alle ore 21:04:16