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Titolo:
Apertureless scanning near-field infrared microscopy of a rough polymeric surface
Autore:
Akhremitchev, BB; Pollack, S; Walker, GC;
Indirizzi:
Univ Pittsburgh, Dept Chem, Chevron Sci Ctr G12, Pittsburgh, PA 15260 USA Univ Pittsburgh Pittsburgh PA USA 15260 Ctr G12, Pittsburgh, PA 15260 USA Howard Univ, Dept Chem, Washington, DC 20059 USA Howard Univ Washington DC USA 20059 , Dept Chem, Washington, DC 20059 USA
Titolo Testata:
LANGMUIR
fascicolo: 9, volume: 17, anno: 2001,
pagine: 2774 - 2781
SICI:
0743-7463(20010501)17:9<2774:ASNIMO>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-FORCE MICROSCOPY; OPTICAL MICROSCOPY; PROBE; RESOLUTION; CONTRAST; MODE; SCATTERING; SPECTROSCOPY; ENHANCEMENT; ARTIFACTS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
50
Recensione:
Indirizzi per estratti:
Indirizzo: Walker, GC Univ Pittsburgh, Dept Chem, Chevron Sci Ctr G12, Pittsburgh, PA15260 USA Univ Pittsburgh Pittsburgh PA USA 15260 ttsburgh, PA 15260 USA
Citazione:
B.B. Akhremitchev et al., "Apertureless scanning near-field infrared microscopy of a rough polymeric surface", LANGMUIR, 17(9), 2001, pp. 2774-2781

Abstract

Infrared near-field microscopy using an apertureless probe technique has been accomplished to study the surface of a cast copolymer film. Two basic models for the predicted signal and the experimental data are presented. Thefirst model includes plane wave light scattering by a conductive sphere and an infinitely wide absorptive layer placed on a semi-infinite conductor. This model shows infrared signal dependence on the layer absorption and predicts topographic coupling into the infrared signal. The experimental data also indicate that a significant component in the infrared contrast arises from the probe following the sample's topography, and a method to eliminatethe influence of topography following is demonstrated. The images corrected by such a procedure show spatial resolution of approximately lambda /80. A more complex model based on a three-dimensional finite difference time domain method was used to calculate scattering from a rough surface. Both constant tip-sample gap and constant tip-substrate height analyses were made, and it is found that constant height imaging is a preferred mode of operation. Calculations for dielectric and Lorentzian materials are reported. These calculations indicate that the near-field infrared signal attenuation foran absorptive object is larger than for a bare layer of the same thickness. This effect may be used to enhance chemical contrast in near-field imaging.

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Documento generato il 28/01/20 alle ore 21:02:12