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Titolo:
Probe design optimization for a high-resolution scattering-type scanning near-field optical microscope
Autore:
Sasaki, Y; Sasaki, H;
Indirizzi:
Olympus Opt Co Ltd, Hachioji, Tokyo 1928512, Japan Olympus Opt Co Ltd Hachioji Tokyo Japan 1928512 oji, Tokyo 1928512, Japan
Titolo Testata:
JOURNAL OF MICROSCOPY-OXFORD
, volume: 202, anno: 2001,
parte:, 2
pagine: 347 - 350
SICI:
0022-2720(200105)202:<347:PDOFAH>2.0.ZU;2-A
Fonte:
ISI
Lingua:
ENG
Keywords:
finite difference time domain method; reflection-mode scattering-type scanning near-field optical microscope; scattering probe;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Life Sciences
Citazioni:
7
Recensione:
Indirizzi per estratti:
Indirizzo: Sasaki, Y Olympus Opt Co Ltd, 2-3 Kuboyama Cho, Hachioji, Tokyo 1928512, Japan Olympus Opt Co Ltd 2-3 Kuboyama Cho Hachioji Tokyo Japan 1928512
Citazione:
Y. Sasaki e H. Sasaki, "Probe design optimization for a high-resolution scattering-type scanning near-field optical microscope", J MICROSC O, 202, 2001, pp. 347-350

Abstract

The scattering-type scanning near-field optical microscope (SNOM) has a probe with a sharp tip for use in high resolution imaging. As sharp a tip as possible is generally considered ideal for the observations, but actually asharp tip does not always provide a high resolution SNOM image. We numerically examined the scattering property of the SNOM probe by the three dimensional finite difference time domain method. In this paper, we show the criterion for the ideal scattering probe which satisfies the simple relation between radius and taper angle of the tip.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/11/20 alle ore 02:45:57