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Titolo:
Grain boundary grooving with simultaneous grain boundary sliding in Ni-rich NiAl
Autore:
Rabkin, E; Klinger, L; Izyumova, T; Berner, A; Semenov, V;
Indirizzi:
Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel Technion Israel Inst Technol Haifa Israel IL-32000 L-32000 Haifa, Israel Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia Russian Acad Sci Chernogolovka Russia 142432 hernogolovka 142432, Russia
Titolo Testata:
ACTA MATERIALIA
fascicolo: 8, volume: 49, anno: 2001,
pagine: 1429 - 1438
SICI:
1359-6454(20010508)49:8<1429:GBGWSG>2.0.ZU;2-Y
Fonte:
ISI
Lingua:
ENG
Soggetto:
ELECTRON-MICROSCOPY; FORCE; DIFFUSION; ROTATION; ANGLE;
Keywords:
atomic force microscopy (AFM); intermetallic compounds; surface diffusion; grain boundaries;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
21
Recensione:
Indirizzi per estratti:
Indirizzo: Rabkin, E Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel Technion Israel Inst Technol Haifa Israel IL-32000 ifa, Israel
Citazione:
E. Rabkin et al., "Grain boundary grooving with simultaneous grain boundary sliding in Ni-rich NiAl", ACT MATER, 49(8), 2001, pp. 1429-1438

Abstract

Thermal grooving at grain boundaries in Ni-rich NiAI was studied by atomicforce microscopy technique. The determined average ratio of grain boundaryto surface energy for large-angle grain boundaries at 1400 degreesC is 0.45, which is in a good agreement with the results of computer simulations. It has been found that in most cases thermal grooving at the grain boundaries is accompanied by relative shift of the adjacent grains. This shift is associated with the grain boundary sliding caused by the relaxation of internal substructure of the specimen. A model of grain boundary grooving with the simultaneous sliding is developed. The calculated grain boundary groove profiles are in a good agreement with the experimentally measured ones. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

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Documento generato il 08/07/20 alle ore 06:08:54