Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
A nondestructive technique for determining the spring constant of atomic force microscope cantilevers
Autore:
Gibson, CT; Weeks, BL; Lee, JRI; Abell, C; Rayment, T;
Indirizzi:
Univ Cambridge, Dept Chem, Cambridge CB2 1EW, England Univ Cambridge Cambridge England CB2 1EW hem, Cambridge CB2 1EW, England
Titolo Testata:
REVIEW OF SCIENTIFIC INSTRUMENTS
fascicolo: 5, volume: 72, anno: 2001,
pagine: 2340 - 2343
SICI:
0034-6748(200105)72:5<2340:ANTFDT>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
CALIBRATION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
28
Recensione:
Indirizzi per estratti:
Indirizzo: Gibson, CT Univ Cambridge, Dept Chem, Lensfield Rd, Cambridge CB2 1EW, England Univ Cambridge Lensfield Rd Cambridge England CB2 1EW England
Citazione:
C.T. Gibson et al., "A nondestructive technique for determining the spring constant of atomic force microscope cantilevers", REV SCI INS, 72(5), 2001, pp. 2340-2343

Abstract

We present a simple, accurate, and nondestructive method to determine cantilever spring constants by measuring the resonant frequency before and after the addition of a thin gold layer. The method for resonating the cantilevers uses electrostatic force modulation, which has been described for conductive cantilevers, but we demonstrate it can also be applied to silicon nitride cantilevers. The variations in spring constant for cantilevers of the same type across the same wafer are also explored. (C) 2001 American Institute of Physics.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/12/20 alle ore 01:26:19