Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
GaAs wafer mapping by microwave-detected photoconductivity
Autore:
Niklas, JR; Siegel, W; Jurisch, M; Kretzer, U;
Indirizzi:
Tech Univ, Bergakad Freiberg, D-09596 Freiberg, Germany Tech Univ Freiberg Germany D-09596 d Freiberg, D-09596 Freiberg, Germany Freiberger Cpd Mat GMBH, D-09599 Freiberg, Germany Freiberger Cpd Mat GMBH Freiberg Germany D-09599 09599 Freiberg, Germany
Titolo Testata:
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
fascicolo: 1-3, volume: 80, anno: 2001,
pagine: 206 - 209
SICI:
0921-5107(20010322)80:1-3<206:GWMBMP>2.0.ZU;2-O
Fonte:
ISI
Lingua:
ENG
Keywords:
gallium arsenide; semi-insulating; homogeneity; photoconductivity; microwave spectroscopy;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
9
Recensione:
Indirizzi per estratti:
Indirizzo: Niklas, JR Tech Univ, Bergakad Freiberg, Silbermannstr 1, D-09596 Freiberg, Germany Tech Univ Silbermannstr 1 Freiberg Germany D-09596 rg, Germany
Citazione:
J.R. Niklas et al., "GaAs wafer mapping by microwave-detected photoconductivity", MAT SCI E B, 80(1-3), 2001, pp. 206-209

Abstract

An improved highly sensitive method of detecting photo conductivity bq microwave absorption (MDP) is described. The method is applicable to semi-insulating and low resistivity marterial as well. It is non-destructive and canbe applied to epi-layers. MBP topograms art compared with those for photo luminescence, point contact. and EL2 using the same sample. The MDP-contrast is mainly due to a so far unknown recombination centre determining the carrier lifetime under non-equilibrium. The annealing behaviour of MDP is very similar to that of the point-contact method. In general, MDP has the potential to be used as a new tool for material duality inspection with direct evidence for device properties. (C) 2001 Published by Elsevier Science B.V.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 06/07/20 alle ore 08:30:42