Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
A novel programming technique for highly scalable and disturbance immune flash EEPROM
Autore:
Huang, KC; Fang, YK; Yaung, DN; Chen, CH; Hsu, YL; Ting, SF; Lin, Y; Kuo, DS; Wang, CS; Liang, MS;
Indirizzi:
Natl Cheng Kung Univ, Dept Elect Engn, Inst Microelect, VLSI Technol Lab, Tainan 70101, Taiwan Natl Cheng Kung Univ Tainan Taiwan 70101 chnol Lab, Tainan 70101, Taiwan Taiwan Semicond Mfg Co Ltd, Hsinchu 300, Taiwan Taiwan Semicond Mfg Co Ltd Hsinchu Taiwan 300 o Ltd, Hsinchu 300, Taiwan
Titolo Testata:
SOLID-STATE ELECTRONICS
fascicolo: 2, volume: 45, anno: 2001,
pagine: 297 - 301
SICI:
0038-1101(200102)45:2<297:ANPTFH>2.0.ZU;2-6
Fonte:
ISI
Lingua:
ENG
Soggetto:
MEMORY;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
--discip_EC--
Citazioni:
10
Recensione:
Indirizzi per estratti:
Indirizzo: Fang, YK Natl Cheng Kung Univ, Dept Elect Engn, Inst Microelect, VLSI Technol Lab, 1 Univ Rd, Tainan 70101, Taiwan Natl Cheng Kung Univ 1 Univ Rd Tainan Taiwan 70101 70101, Taiwan
Citazione:
K.C. Huang et al., "A novel programming technique for highly scalable and disturbance immune flash EEPROM", SOL ST ELEC, 45(2), 2001, pp. 297-301

Abstract

The program speed of a selected cell and the program disturbance of unselected cells sharing the common program-line in split-gate source-side injected flash memory has been investigated. It is found that the program disturbance becomes severe as the control gate length decreases. In this letter, we first propose a novel program technique by applying a negative bias to inhibited word-line to improve the trade-off between program speed and program disturbance. The experimental results indicate that the new program technique is a good candidate for future high-density, high-disturbance-immunityflash EEPROM memory applications. (C) 2001 Elsevier Science Ltd. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 14/11/18 alle ore 03:10:36