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Titolo:
320x240 GaAs pixel detectors with improved X-ray imaging quality
Autore:
Irsigler, R; Andersson, J; Alverbro, J; Fakoor-Biniaz, Z; Frojdh, C; Helander, P; Martijn, H; Meikle, D; Ostlund, M; OShea, V; Smith, K;
Indirizzi:
ACREO AB, SE-16440 Kista, Sweden ACREO AB Kista Sweden SE-16440ACREO AB, SE-16440 Kista, Sweden Mitthgsk, REGAM Med Syst Int AB, SE-85170 Sundsvall, Sweden Mitthgsk Sundsvall Sweden SE-85170 st Int AB, SE-85170 Sundsvall, Sweden Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland Univ Glasgow Glasgow Lanark Scotland G12 8QQ ow G12 8QQ, Lanark, Scotland
Titolo Testata:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
fascicolo: 1, volume: 460, anno: 2001,
pagine: 67 - 71
SICI:
0168-9002(20010311)460:1<67:3GPDWI>2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
3
Recensione:
Indirizzi per estratti:
Indirizzo: Irsigler, R ACREO AB, Electrum 233, SE-16440 Kista, Sweden ACREO AB Electrum 233 Kista Sweden SE-16440 440 Kista, Sweden
Citazione:
R. Irsigler et al., "320x240 GaAs pixel detectors with improved X-ray imaging quality", NUCL INST A, 460(1), 2001, pp. 67-71

Abstract

We report on gain and offset corrections for GaAs X-ray pixel detectors, which were hybridised to silicon CMOS readout integrated circuits (ROICs). The whole detector array contains 320 x 240 square-shaped pixels with a pitch of 38 mum. The GaAs pixel detectors are based on semi-insulating and VPE grown substrates. The ROIC operates in the charge integration mode and provides snapshot as well as real time video images. Previously we have reported that the image quality of semi-insulating GaAs pixel detectors suffer from local variations in X-ray sensitivity. We have now developed a method to compensate for the sensitivity variations by applying suitable offset and gain corrections. The improvement in image quality is demonstrated in the measured signal-to-noise ratio of flood exposure images. (C) 2001 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 14/07/20 alle ore 04:15:40