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Titolo:
Effect of thin oxide capping on interlayer coupling in spin valves
Autore:
Hong, JI; Aoshima, K; Kane, J; Noma, K; Kanai, H;
Indirizzi:
Fujitsu Ltd, File Memory Lab, Atsugi, Kanagawa 2430197, Japan Fujitsu LtdAtsugi Kanagawa Japan 2430197 Atsugi, Kanagawa 2430197, Japan
Titolo Testata:
IEEE TRANSACTIONS ON MAGNETICS
fascicolo: 5, volume: 36, anno: 2000,
parte:, 1
pagine: 2629 - 2631
SICI:
0018-9464(200009)36:5<2629:EOTOCO>2.0.ZU;2-Y
Fonte:
ISI
Lingua:
ENG
Soggetto:
LAYER THICKNESS; MAGNETORESISTANCE; MULTILAYERS;
Keywords:
antiferromagnetic interlayer coupling; capping effect; specular scattering; spin valve;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
13
Recensione:
Indirizzi per estratti:
Indirizzo: Hong, JI Fujitsu Ltd, File Memory Lab, 10-1 Morinosato Wakamiya, Atsugi, Kanagawa 2430197, Japan Fujitsu Ltd 10-1 Morinosato Wakamiya Atsugi KanagawaJapan 2430197
Citazione:
J.I. Hong et al., "Effect of thin oxide capping on interlayer coupling in spin valves", IEEE MAGNET, 36(5), 2000, pp. 2629-2631

Abstract

We controlled interlayer coupling from ferromagnetic to antiferromagnetic by appropriately capping spin valves with thin oxides. The interlayer coupling field was -16.6 Oe at a Cu-spacer thickness of 30 Angstrom. The sign ofcoupling changed at a Cu-spacer thickness of 20 Angstrom. The antiferromagnetic coupling achieved in this way allowed a reduction of thickness of theCu spacer down to 20 Angstrom without loss of good magnetic and electricalproperties, and this led to a significant improvement in the MR response of the spin valves. The interlayer coupling field was only +8.6 Oe even at aCu-spacer thickness of 20 Angstrom. We attribute the improvement in MR response to less current shunting through the most conductive Cu layer and to enhanced specular scattering at the interface between the free and the oxide capping layer.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/11/20 alle ore 07:05:03