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Titolo:
Twinned LaAlO3 substrate effect on epitaxially grown La-Ca-Mn-O thin film crystalline structure
Autore:
Song, JH; Kim, KK; Oh, YJ; Jung, HJ; Song, JH; Choi, DK; Choi, WK;
Indirizzi:
Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South Korea Korea Inst Sci & Technol Seoul South Korea 130650 ul 130650, South Korea Korea Inst Sci & Technol, Adv Anal Ctr, Seoul 130650, South Korea Korea Inst Sci & Technol Seoul South Korea 130650 ul 130650, South Korea Hanyang Univ, Dept Inorgan Mat Engn, Seongdong Ku, Seoul 133791, South Korea Hanyang Univ Seoul South Korea 133791 dong Ku, Seoul 133791, South Korea
Titolo Testata:
JOURNAL OF CRYSTAL GROWTH
fascicolo: 1-2, volume: 223, anno: 2001,
pagine: 129 - 134
SICI:
0022-0248(200102)223:1-2<129:TLSEOE>2.0.ZU;2-K
Fonte:
ISI
Lingua:
ENG
Soggetto:
3-DIMENSIONAL STRAIN STATES; MOLECULAR-BEAM EPITAXY; LARGE MAGNETORESISTANCE; LA0.67CA0.33MNO3; LA0.7CA0.3MNO3; DEPENDENCE; TRANSPORT;
Keywords:
characterization; crystal structure; high resolution X-ray diffraction; stresses; substrates; X-ray diffraction; physical vapor deposition processes; manganites; perovskites;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
18
Recensione:
Indirizzi per estratti:
Indirizzo: Choi, WK Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Cheongryang POB 131, Seoul 130650, South Korea Korea Inst Sci & Technol Cheongryang POB131 Seoul South Korea 130650
Citazione:
J.H. Song et al., "Twinned LaAlO3 substrate effect on epitaxially grown La-Ca-Mn-O thin film crystalline structure", J CRYST GR, 223(1-2), 2001, pp. 129-134

Abstract

La-Ca-Mn-O (LCMO) thin film was epitaxially grown on LaAlO3 (1 0 0) substrate using RF magnetron sputtering. The epitaxial relationship between LCMO and LaAlO3 (LAO), was characterized using MeV He-4(2+) backscattering (BS)/channeling and a 4-circle X-ray diffractometer (XRD). The LCMO film deposited at 600 degreesC with an RF power of 100 W showed the channeling minimum yield of 4.98% indicating its excellent crystallinity and high c-axis orientation. Through channeling angular scan measurement, it is confirmed that the 145 nm thick LCMO thin film conserved the compressive stress. The FWHM value of LCMO (2 0 0) peak in XRD theta -rocking is mainly influenced by thetwin structure of LAO substrate. It is also interesting that the twin angle of LAO substrate, 0.18 degrees, is very close to the separation of two peaks, 0.20 degrees, in XRD theta -rocking scan on LCMO (2 0 0) peak. From these results, it is suggested that these two subpeaks in XRD theta -20 curvewere originated from each twinned plane rather than coexistence of strained and relaxed layers. In addition, the FWHM of LCMO (2 0 0) peak obtained from high-resolution XRD D-rocking, 0.147 degrees, is smaller than any valueever reported. (C) 2001 Published by Elsevier Science B.V.

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Documento generato il 30/10/20 alle ore 23:17:02