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Titolo:
Small polaron of beta-FeSi2 obtained from optical measurements
Autore:
Kakemoto, H; Makita, Y; Kino, Y; Sakuragi, S; Tsukamoto, T;
Indirizzi:
Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan Electrotech Lab Tsukuba Ibaraki Japan 3058568 uba, Ibaraki 3058568, Japan Rigaku Co Ltd, Akishima, Tokyo 1968666, Japan Rigaku Co Ltd Akishima Tokyo Japan 1968666 Akishima, Tokyo 1968666, Japan Union Mat, Ibaraki, Osaka 3001602, Japan Union Mat Ibaraki Osaka Japan 3001602 Mat, Ibaraki, Osaka 3001602, Japan Sci Univ Tokyo, Fac Sci, Dept Appl Phys, Shinjuku Ku, Tokyo 1620825, JapanSci Univ Tokyo Tokyo Japan 1620825 ys, Shinjuku Ku, Tokyo 1620825, Japan
Titolo Testata:
THIN SOLID FILMS
fascicolo: 2, volume: 381, anno: 2001,
pagine: 251 - 255
SICI:
0040-6090(20010115)381:2<251:SPOBOF>2.0.ZU;2-6
Fonte:
ISI
Lingua:
ENG
Soggetto:
SINGLE-CRYSTALS;
Keywords:
Raman scattering spectrum; optical reflection spectrum; dielectric constants; small polaron;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
18
Recensione:
Indirizzi per estratti:
Indirizzo: Kakemoto, H Electrotech Lab, 1-1-4 Umezono, Tsukuba, Ibaraki 3058568, Japan Electrotech Lab 1-1-4 Umezono Tsukuba Ibaraki Japan 3058568 an
Citazione:
H. Kakemoto et al., "Small polaron of beta-FeSi2 obtained from optical measurements", THIN SOL FI, 381(2), 2001, pp. 251-255

Abstract

Beta-iron disilicide beta -FeSi2 polycrystals were synthesized by the horizontal gradient freeze method, and beta -FeSi2 single crystals were grown by the chemical vapor transport method using polycrystals as the starting material and iodine as a transport agent. The beta -FeSi2 polycrystals and single crystals were characterized by optical measurements. The Raman and infrared active optical phonons were observed by Raman scattering and optical reflection measurements, respectively. The dielectric constants were calculated by Kramers-Kronig transformation of the optical reflection spectrum. The small polaron reflecting LO phonon of beta -FeSi2 was discussed by Frohlich's model using the obtained dielectric constants. (C) 2001 Published by Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/11/20 alle ore 03:26:06