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Titolo:
Writing and reading perpendicular magnetic recording media patterned by a focused ion beam
Autore:
Lohau, J; Moser, A; Rettner, CT; Best, ME; Terris, BD;
Indirizzi:
IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA IBM Corp San Jose CA USA 95120 p, Almaden Res Ctr, San Jose, CA 95120 USA
Titolo Testata:
APPLIED PHYSICS LETTERS
fascicolo: 7, volume: 78, anno: 2001,
pagine: 990 - 992
SICI:
0003-6951(20010212)78:7<990:WARPMR>2.0.ZU;2-Q
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
12
Recensione:
Indirizzi per estratti:
Indirizzo: Lohau, J IBM Corp, Almaden Res Ctr, 650 Harry Rd, San Jose, CA 95120 USA IBM Corp 650 Harry Rd San Jose CA USA 95120 an Jose, CA 95120 USA
Citazione:
J. Lohau et al., "Writing and reading perpendicular magnetic recording media patterned by a focused ion beam", APPL PHYS L, 78(7), 2001, pp. 990-992

Abstract

We have written and read bit patterns on arrays of square islands cut witha focused ion beam into granular perpendicular magnetic recording media. Using a static write-read tester, we have written square-wave bit patterns on arrays of islands with sizes between 60 and 230 nm, matching the recording linear density to the pattern period. These measurements reveal the onsetof single-domain behavior for islands smaller than 130 nm, in agreement with magnetic force microscope images. The recording performance of patternedregions is systematically compared to that of unpatterned regions. (C) 2001 American Institute of Physics.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 02/04/20 alle ore 09:21:57