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Titolo:
Sol-gel preparation and characterization of Ag-TiO2 nanocomposite thin films
Autore:
Traversa, E; Di Vona, ML; Nunziante, P; Licoccia, S; Sasaki, T; Koshizaki, N;
Indirizzi:
Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, INSTM, I-00133 Rome, Italy Univ Roma Tor Vergata Rome Italy I-00133 him, INSTM, I-00133 Rome, Italy MITI, Agcy Ind Sci & Technol, Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058565, Japan MITI Tsukuba Ibaraki Japan 3058565 m Res, Tsukuba, Ibaraki 3058565, Japan
Titolo Testata:
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
fascicolo: 1-3, volume: 19, anno: 2000,
pagine: 733 - 736
SICI:
0928-0707(200012)19:1-3<733:SPACOA>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Soggetto:
PHOTOELECTROCHEMICAL PROPERTIES; METAL PARTICLES; TIO2 FILMS;
Keywords:
nanocomposite; Ag-TiO2; thin films; XPS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
11
Recensione:
Indirizzi per estratti:
Indirizzo: Traversa, E Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, INSTM, Via Ric Sci,I-00133 Rome, Italy Univ Roma Tor Vergata Via Ric Sci Rome Italy I-00133 e, Italy
Citazione:
E. Traversa et al., "Sol-gel preparation and characterization of Ag-TiO2 nanocomposite thin films", J SOL-GEL S, 19(1-3), 2000, pp. 733-736

Abstract

Ag-TiO2 thin films were prepared with a sol-gel route, using titanium isopropoxide and silver nitrate as precursors, at 0.03 and 0.06 Ag/Ti nominal atomic ratios. After drying at 80 degreesC, the films were fired at 300 degreesC and 500 degreesC for 30 min. The films were analysed by X-ray diffraction (XRD) with glancing angle, and X-ray photoelectron spectroscopy (XPS), with depth profiling of the concentration. XPS analysis showed the presenceof C and N as impurities in the nanocomposite films. Their concentration decreased with increasing the firing temperature. Chemical state analysis showed that Ag was present in metallic state, except for the very outer layerwhere it was present as Ag+. For the films prepared with a Ag/Ti concentration of 0.06, depth profiling measurements of the film fired at 300 degreesC showed a strong Ag enrichment at the outer surface, while composition remained almost constant within the rest of the film, at 0.019. For the films heated to 500 degreesC, two layers were found, where the Ag/Ti ratios were 0.015 near the surface and 0.026 near the substrate.

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Documento generato il 06/07/20 alle ore 07:09:13