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Titolo:
Sublattice resolution structural and chemical analysis of individual CdSe nanocrystals using atomic number contrast scanning transmission electron microscopy and electron energy loss spectroscopy
Autore:
Kadavanich, AV; Kippeny, TC; Erwin, MM; Pennycook, SJ; Rosenthal, SJ;
Indirizzi:
Vanderbilt Univ, Dept Chem, Nashville, TN 37235 USA Vanderbilt Univ Nashville TN USA 37235 Dept Chem, Nashville, TN 37235 USA Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab Oak Ridge TN USA 37831 State, Oak Ridge, TN 37831 USA
Titolo Testata:
JOURNAL OF PHYSICAL CHEMISTRY B
fascicolo: 2, volume: 105, anno: 2001,
pagine: 361 - 369
SICI:
1520-6106(20010118)105:2<361:SRSACA>2.0.ZU;2-L
Fonte:
ISI
Lingua:
ENG
Soggetto:
SEMICONDUCTOR QUANTUM DOTS; CADMIUM SELENIDE NANOCRYSTALS; PERMANENT DIPOLE-MOMENT; LIGHT-EMITTING-DIODES; IMAGE-RECONSTRUCTION; OPTICAL-PROPERTIES; CHARGE SEPARATION; PHOTOLUMINESCENCE; CRYSTALS; NANOCLUSTERS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
71
Recensione:
Indirizzi per estratti:
Indirizzo: Rosenthal, SJ Vanderbilt Univ, Dept Chem, Box 1583, Nashville, TN 37235 USA Vanderbilt Univ Box 1583 Nashville TN USA 37235 TN 37235 USA
Citazione:
A.V. Kadavanich et al., "Sublattice resolution structural and chemical analysis of individual CdSe nanocrystals using atomic number contrast scanning transmission electron microscopy and electron energy loss spectroscopy", J PHYS CH B, 105(2), 2001, pp. 361-369

Abstract

Atomic number contrast scanning transmission electron microscopy (Z-STEM),with atomic resolution and sub-nanometer resolution scanning transmission electron microscope electron energy loss spectroscopy (STEM-EELS), was usedto study single colloidal CdSe semiconductor nanocrystals embedded in MEH-PPV polymer films. The atomic column-resolved Z-STEM image provides information both on the lateral shape of the nanocrystal, as well as the relative thickness of the individual atom columns from a single image. The three-dimensional shape profile reconstructed from the data matches the predicted model. Furthermore, the sublattice is resolved so the polar surfaces can be uniquely identified. Sub-nanometer resolution EELS measurements on an individual nanocrystal indicate the presence of oxygen. The spatial distribution of the oxygen signal in the EELS measurement suggests a thin oxide layer onthe nanocrystal surface.

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Documento generato il 19/01/20 alle ore 20:45:22