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Titolo:
Using neural network analysis to uncover the trace effects of national culture
Autore:
Veiga, JF; Lubatkin, M; Calori, R; Very, P; Tung, YA;
Indirizzi:
Univ Connecticut, Sch Business, Dept Management, Storrs, CT 06268 USA UnivConnecticut Storrs CT USA 06268 ept Management, Storrs, CT 06268 USA Grp ESC Lyon, Lyon, France Grp ESC Lyon Lyon FranceGrp ESC Lyon, Lyon, France
Titolo Testata:
JOURNAL OF INTERNATIONAL BUSINESS STUDIES
fascicolo: 2, volume: 31, anno: 2000,
pagine: 223 - 238
SICI:
0047-2506(2000)31:2<223:UNNATU>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Soggetto:
PERFORMANCE; BEHAVIOR; MERGERS; FIRMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Social & Behavioral Sciences
--discip_BC--
Citazioni:
40
Recensione:
Indirizzi per estratti:
Indirizzo: Veiga, JF Univ Connecticut, Sch Business, Dept Management, Storrs, CT 06268 USA Univ Connecticut Storrs CT USA 06268 ment, Storrs, CT 06268 USA
Citazione:
J.F. Veiga et al., "Using neural network analysis to uncover the trace effects of national culture", J INT BUS S, 31(2), 2000, pp. 223-238

Abstract

The primary objective of this paper an artificial intelligence technique known as neural network analysis as an aid to uncovering the underlying patterns, or trace effects, of national culture. To make our case, we provide an application of the technique's pattern recognition capability utilizing survey data from top executives in French and British firms. We conclude by interpreting rbe trace effects found and encouraging aging the use of this tool by crosscultural researchers in the future.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 24/09/20 alle ore 05:12:07