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Titolo:
Enhancement of the characteristic X-ray yield from oriented crystal irradiated by high-energy electrons
Autore:
Andreyashkin, M; Inoue, M; Nakagawa, H; Yoshida, K; Okuno, H; Hamatsu, R; Kojima, H; Masuyama, M; Miyakawa, T; Umemori, K; Potylitsin, A; Vnukov, I; Takashima, Y; Anami, S; Enomoto, A; Furukawa, K; Kamitani, T; Ogawa, Y; Ohsawa, S;
Indirizzi:
Tokyo Metropolitan Univ, Grad Sch Sci, Dept Phys, Hachioji, Tokyo 1920397,Japan Tokyo Metropolitan Univ Hachioji Tokyo Japan 1920397 Tokyo 1920397,Japan High Energy Accelerator Res Org, Tanashi, Tokyo 1888501, Japan High EnergyAccelerator Res Org Tanashi Tokyo Japan 1888501 888501, Japan Tokyo Univ Agr & Technol, Koganei, Tokyo 1840012, Japan Tokyo Univ Agr & Technol Koganei Tokyo Japan 1840012 Tokyo 1840012, Japan Univ Tokyo, Dept Phys, Bunkyo Ku, Tokyo 1130032, Japan Univ Tokyo Tokyo Japan 1130032 ept Phys, Bunkyo Ku, Tokyo 1130032, Japan Tomsk Polytech Univ, Inst Nucl Phys, Tomsk 50, Russia Tomsk Polytech UnivTomsk Russia 50 iv, Inst Nucl Phys, Tomsk 50, Russia Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan Nagoya Univ Nagoya Aichi Japan 4648603 a Ku, Nagoya, Aichi 4648603, Japan High Energy Accelerator Re Org, Tsukuba, Ibaraki 3050801, Japan High Energy Accelerator Re Org Tsukuba Ibaraki Japan 3050801 50801, Japan
Titolo Testata:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
fascicolo: 1-2, volume: 173, anno: 2001,
pagine: 142 - 148
SICI:
0168-583X(200101)173:1-2<142:EOTCXY>2.0.ZU;2-J
Fonte:
ISI
Lingua:
ENG
Soggetto:
POSITRON;
Keywords:
characteristic X-ray; relativistic electrons; oriented crystal;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
10
Recensione:
Indirizzi per estratti:
Indirizzo: Hamatsu, R Tokyo Metropolitan Univ, Grad Sch Sci, Dept Phys, 1-1 Minami Ohsawa, Hachioji, Tokyo 1920397, Japan Tokyo Metropolitan Univ 1-1 Minami Ohsawa Hachioji Tokyo Japan 1920397
Citazione:
M. Andreyashkin et al., "Enhancement of the characteristic X-ray yield from oriented crystal irradiated by high-energy electrons", NUCL INST B, 173(1-2), 2001, pp. 142-148

Abstract

In this report, results of a measurement of characteristic X-ray (CXR) yields from oriented tungsten crystal targets irradiated by 600-1000 MeV electrons are presented. Characteristic X-rays from tungsten are measured with aSi(Li) semiconductor detector placed at the backward direction with respect to the incident electron beam. We have observed an enhancement of the X-ray yield due to the K-shell ionization when the crystal axis [1 1 1] is oriented along the beam. The ratio of the K-line yield from the oriented crystal to the one from the disoriented crystal is about 1.6-1.9 for the target thickness of 1.2 mm at the electron energy of 1000 MeV, For L-line yields the enhancement is not appreciable, We demonstrated a possibility of using the orientation dependence of the CXR as a mean of aligning the crystal axisat the channeling condition to the beam. (C) 2001 Elsevier Science B.V. All rights reserved.

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Documento generato il 15/01/21 alle ore 22:06:54