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Titolo:
Anomalies in the optical index of refraction of spun cast polystyrene thinfilms
Autore:
Hu, XS; Shin, K; Rafailovich, M; Sokolov, J; Stein, R; Chan, Y; Williams, K; Wu, WL; Kolb, R;
Indirizzi:
SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA SUNY Stony Brook Stony Brook NY USA 11794 Engn, Stony Brook, NY 11794 USA Univ Massachusetts, Dept Chem & Engn, Amherst, MA 01003 USA Univ Massachusetts Amherst MA USA 01003 hem & Engn, Amherst, MA 01003 USA Wheatley High Sch, Old Westbury, NY 11568 USA Wheatley High Sch Old Westbury NY USA 11568 h, Old Westbury, NY 11568 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol Gaithersburg MD USA 20899 ersburg, MD 20899 USA Veeco Instruments Inc, Plainview, NY 11803 USA Veeco Instruments Inc Plainview NY USA 11803 Inc, Plainview, NY 11803 USA Exxon Res & Engn Co, Annandale, NJ 08801 USA Exxon Res & Engn Co Annandale NJ USA 08801 gn Co, Annandale, NJ 08801 USA
Titolo Testata:
HIGH PERFORMANCE POLYMERS
fascicolo: 4, volume: 12, anno: 2000,
pagine: 621 - 629
SICI:
0954-0083(200012)12:4<621:AITOIO>2.0.ZU;2-4
Fonte:
ISI
Lingua:
ENG
Soggetto:
SOLVENT;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
11
Recensione:
Indirizzi per estratti:
Indirizzo: Hu, XS SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA SUNY Stony Brook Stony Brook NY USA 11794 tony Brook, NY 11794 USA
Citazione:
X.S. Hu et al., "Anomalies in the optical index of refraction of spun cast polystyrene thinfilms", HIGH PERF P, 12(4), 2000, pp. 621-629

Abstract

We used x-ray reflectivity in combination with optical ellipsometry to measure the optical index of refraction, n, in thin spun cast polystyrene films. We have found that n is independent of the molecular weight, but is a sharp Function of the film thickness for films less than 100 nm. in all casesthe deviation from the bulk, Deltan, is negative and varies linearly with wavelength in the visible region. The magnitude of Deltan, was found to be as large as 0.25 for films 7 nm thick. The bulk index of refraction was recovered in all films after annealing for 2 h above T-g at 160 degreesC. X-ray reflectivity measurements of the scattering critical angle show minimal density deviations from the bulk (less than 0.5%) between the annealed and unannealed films. Consequently the large molecular-weight-independent value of Deltan is interpreted as being due to a radially symmetric segmental orientation induced by the spinning process.

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Documento generato il 15/07/20 alle ore 07:57:03