Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Modeling of submicron Si-MOSFET's for microwave applications with unique extraction of small-signal characteristic parameters
Autore:
Baek, KH; Lim, GM; Cho, SD; Kim, YC; Kim, HC; Kim, SK; Kim, DJ; Kim, DM;
Indirizzi:
Kookmin Univ, Sch Elect Engn, Seoul 136702, South Korea Kookmin Univ Seoul South Korea 136702 ct Engn, Seoul 136702, South Korea
Titolo Testata:
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
fascicolo: 6, volume: 37, anno: 2000,
pagine: 915 - 922
SICI:
0374-4884(200012)37:6<915:MOSSFM>2.0.ZU;2-O
Fonte:
ISI
Lingua:
ENG
Soggetto:
EQUIVALENT-CIRCUIT; MESFETS; CMOS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
13
Recensione:
Indirizzi per estratti:
Indirizzo: Baek, KH Kookmin Univ, Sch Elect Engn, Seoul 136702, South Korea Kookmin Univ Seoul South Korea 136702 Seoul 136702, South Korea
Citazione:
K.H. Baek et al., "Modeling of submicron Si-MOSFET's for microwave applications with unique extraction of small-signal characteristic parameters", J KOR PHYS, 37(6), 2000, pp. 915-922

Abstract

In this paper, a new small-signal equivalent model and an efficient parameter extraction method (zero-g(m) method), based on the measured S-parameters, are proposed for microwave applications of submicron (L-g=0.6 mum) Si-MOSFET's. The ambiguity between the channel charging resistance R-gsi and thetransconductance delay tau in conventional models (g(m)=g(mo)e(-j alpha pi)) are also clarified. Without a conventional de-embedding process, which uses additional test patterns with exactly the same geometrical structures as the device under test. extrinsic parameters, including contact pads and interconnection lines of the DUT, are uniquely extracted at zero-g(m) bias condition (V-GS \(gm=0) = -0.25 V, V-DS = 0 V) from 45 MHz to 30 GHz. For a simple and accurate small-signal model for microwave applications, a nonlinear curve fitting of an analytical 2-port network parameter equation is employed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/11/20 alle ore 02:54:29