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Titolo:
Time-resolved crystallization study of absorbable polymers by synchrotron small-angle X-ray scattering
Autore:
Andjelic, S; Jamiolkowski, D; McDivitt, J; Fischer, J; Zhou, J; Wang, ZG; Hsiao, BS;
Indirizzi:
Ethicon Inc, Somerville, NJ 08876 USA Ethicon Inc Somerville NJ USA 08876Ethicon Inc, Somerville, NJ 08876 USA SUNY Stony Brook, Dept Chem, Stony Brook, NY 11794 USA SUNY Stony Brook Stony Brook NY USA 11794 Chem, Stony Brook, NY 11794 USA
Titolo Testata:
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
fascicolo: 1, volume: 39, anno: 2001,
pagine: 153 - 167
SICI:
0887-6266(20010101)39:1<153:TCSOAP>2.0.ZU;2-2
Fonte:
ISI
Lingua:
ENG
Soggetto:
MELTING BEHAVIOR; ETHER KETONE); BLEND; SAXS; POLY(EPSILON-CAPROLACTONE); RADIATION;
Keywords:
poly(p-dioxanone); absorbable polymers; crystallization; synchrotron; small-angle X-ray scattering;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
24
Recensione:
Indirizzi per estratti:
Indirizzo: Andjelic, S Ethicon Inc, POB 151, Somerville, NJ 08876 USA Ethicon Inc POB151 Somerville NJ USA 08876 ille, NJ 08876 USA
Citazione:
S. Andjelic et al., "Time-resolved crystallization study of absorbable polymers by synchrotron small-angle X-ray scattering", J POL SC PP, 39(1), 2001, pp. 153-167

Abstract

Changes in the lamellar morphology that occurred during the quiescent isothermal crystallization of absorbable poly(p-dioxanone) (PDS) and PDS/poly(glycolide) block copolymer were studied by synchrotron small-angle X-ray scattering. Important morphological parameters such as the lamellar long period, the thicknesses of the crystal and amorphous phases, and the scattering invariant were estimated as a function of time, and trends observed over a nide range of experimental conditions are discussed. Thicker but more perfect lamellae were detected at higher crystallization temperatures. The breadth of the normalized semilog Lorentz-corrected intensity peak systematically decreased with increasing temperature. In addition, the values of the crystallization half-time and the Avrami exponent (n = 2.5), determined from the real-time changes in the lamellar development, showed superb agreement with the bulk crystallinity data generated from other experimental techniques, such as calorimetry and dielectric relaxation spectroscopy. (C) 2000 John Wiley & Sons, Inc.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 16/07/20 alle ore 19:52:59