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Titolo:
Observation of a trap effect in N/SNS/N structure
Autore:
Wei, J; Hou, YM; Song, PC; Chen, ML; Wu, K; Yan, SS;
Indirizzi:
Beijing Univ, Dept Phys, Beijing 100871, Peoples R China Beijing Univ Beijing Peoples R China 100871 jing 100871, Peoples R China
Titolo Testata:
PHYSICA C
, volume: 341, anno: 2000,
parte:, 3
pagine: 1591 - 1592
SICI:
0921-4534(200011)341:<1591:OOATEI>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
4
Recensione:
Indirizzi per estratti:
Indirizzo: Wei, J Beijing Univ, Dept Phys, Beijing 100871, Peoples R China Beijing Univ Beijing Peoples R China 100871 0871, Peoples R China
Citazione:
J. Wei et al., "Observation of a trap effect in N/SNS/N structure", PHYSICA C, 341, 2000, pp. 1591-1592

Abstract

The dV/dI-V curve of Cu/Nb-Cu-Nb/Cu structure with superconductor/normal metal (S/N) interface parallel the current was measured at liquid helium temperature. Resistance rapidly regains and shows a step like feature when thebias is lowered than Delta (Nb)/e. This result can't be explained by conventional theory. A trap effect due to Andreev reflection is proposed to interpret the result.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/01/20 alle ore 12:39:21