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Titolo:
Jitter raising mechanisms for compact disk (CD)-rewritable at quadruple CDvelocity
Autore:
Chang, YY; Chou, LH;
Indirizzi:
Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan Natl Tsing Hua Univ Hsinchu Taiwan 300 t Sci & Engn, Hsinchu 300, Taiwan
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
fascicolo: 12A, volume: 39, anno: 2000,
pagine: L1230 - L1232
SICI:
0021-4922(200012)39:12A<L1230:JRMFCD>2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Soggetto:
CHANGE RECORDING MATERIAL;
Keywords:
Ag-In-Sb-Te; CD-RW; CD linear velocity; erasability; overwrite jitter;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
5
Recensione:
Indirizzi per estratti:
Indirizzo: Chang, YY Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan Natl Tsing Hua Univ Hsinchu Taiwan 300 gn, Hsinchu 300, Taiwan
Citazione:
Y.Y. Chang e L.H. Chou, "Jitter raising mechanisms for compact disk (CD)-rewritable at quadruple CDvelocity", JPN J A P 2, 39(12A), 2000, pp. L1230-L1232

Abstract

A disk designed for compact disk (CD) 2X is employed to test its performance at CD 4X. The eras ability at CD 4X is poorer than that at CD 2X. A sharp increase in jitter after overwriting for CD 4X was observed as a result of the existence of two different amorphous mark shapes. One of them is of normal shape and the other is extended with a tail in the trailing part. Foroverwriting more than 50 times, only one type of amorphous mark with tiny sharp tail was observed. This singular amorphous mark shape gives rise to adecrease in jitter. For much higher overwriting cycles, the jitter will increase with the amount of pinholes present.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 24/09/20 alle ore 08:23:02