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Titolo:
Precipitation of nanometer scale Zn crystalline particles in ZnO-B2O3-SiO2glass during electron irradiation
Autore:
Jiang, N; Qiu, JR; Silcox, J;
Indirizzi:
Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA Cornell Univ Ithaca NY USA 14853 h Appl & Engn Phys, Ithaca, NY 14853 USA Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA Cornell Univ Ithaca NY USA 14853 ornell Ctr Mat Res, Ithaca, NY 14853 USA
Titolo Testata:
APPLIED PHYSICS LETTERS
fascicolo: 24, volume: 77, anno: 2000,
pagine: 3956 - 3958
SICI:
0003-6951(200012)77:24<3956:PONSZC>2.0.ZU;2-G
Fonte:
ISI
Lingua:
ENG
Soggetto:
ENERGY-LOSS SPECTROSCOPY; STIMULATED DESORPTION; SURFACE; DENSITY; STATES; STEM;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
25
Recensione:
Indirizzi per estratti:
Indirizzo: Jiang, N Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA Arizona State Univ Tempe AZ USA 85287 stron, Tempe, AZ 85287 USA
Citazione:
N. Jiang et al., "Precipitation of nanometer scale Zn crystalline particles in ZnO-B2O3-SiO2glass during electron irradiation", APPL PHYS L, 77(24), 2000, pp. 3956-3958

Abstract

In this letter, we report precipitation of nanometer scale Zn crystalline particles in Zn borosilicate glass induced by 100 keV electron irradiation. Nanometer Zn crystalline particles precipitate rapidly in the glass under high intensity electron irradiation. A double ionization mechanism is proposed in interpretation of the formation of Zn particles. Thermal effects areless important than ionization interactions. (C) 2000 American Institute of Physics. [S0003-6951(00)03151-X].

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Documento generato il 07/04/20 alle ore 22:00:44