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Titolo:
Characterisation of silicon strip detectors with a binary readout chip forX-ray imaging
Autore:
Grybos, P; Bialas, W; Cabal, A; Dabrowski, W; Giubellino, P; Idzik, M; Magana-Mendoza, L; Ramello, L; Szczygiel, R; Wheadon, R;
Indirizzi:
Stanislaw Staszic Univ Min & Met, Fac Phys & Nucl Techniques, PL-30059 Krakow, Poland Stanislaw Staszic Univ Min & Met Krakow Poland PL-30059 9 Krakow, Poland Ist Nazl Fis Nucl, I-10125 Turin, Italy Ist Nazl Fis Nucl Turin Italy I-10125 azl Fis Nucl, I-10125 Turin, Italy Univ Piemonte Orientale, DISTA, I-13100 Alessandria, Italy Univ Piemonte Orientale Alessandria Italy I-13100 100 Alessandria, Italy Inst Nucl Phys, Krakow, Poland Inst Nucl Phys Krakow PolandInst Nucl Phys, Krakow, Poland
Titolo Testata:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
fascicolo: 1, volume: 454, anno: 2000,
pagine: 214 - 220
SICI:
0168-9002(20001101)454:1<214:COSSDW>2.0.ZU;2-9
Fonte:
ISI
Lingua:
ENG
Soggetto:
CRYSTALLOGRAPHY;
Keywords:
X-ray detection; front-end electronics; binary readout architecture; silicon strip detectors; ASICs;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
6
Recensione:
Indirizzi per estratti:
Indirizzo: Grybos, P Stanislaw Staszic Univ Min & Met, Fac Phys & Nucl Techniques, AlMickiewicza 30, PL-30059 Krakow, Poland Stanislaw Staszic Univ Min & Met Al Mickiewicza 30 Krakow Poland PL-30059
Citazione:
P. Grybos et al., "Characterisation of silicon strip detectors with a binary readout chip forX-ray imaging", NUCL INST A, 454(1), 2000, pp. 214-220

Abstract

In this paper we describe the development of a multichannel readout systemfor X-ray measurements using silicon strip detectors. The developed systemis based on a binary readout architecture and optimised for detection of X-rays of energies in the range 6-30 keV. The critical component of the system is the 32-channel front-end chip, RX32N, which has been optimised for low noise performance, small channel to channel variation and high counting rate operation. The performance of the chip is demonstrated by measurements of complex X-ray spectra using silicon strip and pad detectors. The obtained results allow to use the system at room temperature with the detection threshold in the range from 500 to 10 000 electrons, which is enough in many crystallographic and medical imaging applications. (C) 2000 Elsevier Science B.V. All rights reserved.

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Documento generato il 29/11/20 alle ore 16:25:05