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Titolo:
Evaluation of structural and adhesive properties of nylon 6 and PTFE alignment films by means of atomic force microscopy
Autore:
Padeletti, G; Pergolini, S; Montesperelli, G; DAlessandro, A; Campoli, F; Maltese, P;
Indirizzi:
CNR, Ist Chim Mat, I-00016 Monterotondo, Roma, Italy CNR Monterotondo Roma Italy I-00016 at, I-00016 Monterotondo, Roma, Italy LOT Oriel Italia, Rome, Italy LOT Oriel Italia Rome ItalyLOT Oriel Italia, Rome, Italy Univ Ancona, Dipartimento Sci Mat & Terra, I-60131 Ancona, Italy Univ Ancona Ancona Italy I-60131 Sci Mat & Terra, I-60131 Ancona, Italy Univ Rome La Sapienza, Dip Ing Elettr, INFM, Rome, Italy Univ Rome La Sapienza Rome Italy nza, Dip Ing Elettr, INFM, Rome, Italy
Titolo Testata:
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
fascicolo: 5, volume: 71, anno: 2000,
pagine: 571 - 576
SICI:
0947-8396(200011)71:5<571:EOSAAP>2.0.ZU;2-Y
Fonte:
ISI
Lingua:
ENG
Soggetto:
THIN-FILMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
14
Recensione:
Indirizzi per estratti:
Indirizzo: Padeletti, G CNR, Ist Chim Mat, Cp 10, I-00016 Monterotondo, Roma, Italy CNR Cp 10 Monterotondo Roma Italy I-00016 otondo, Roma, Italy
Citazione:
G. Padeletti et al., "Evaluation of structural and adhesive properties of nylon 6 and PTFE alignment films by means of atomic force microscopy", APPL PHYS A, 71(5), 2000, pp. 571-576

Abstract

Atomic force microscopy (AFM) has become a powerful technique for submicron investigation of surface properties. In this work we use the capability of this technique to investigate dielectric films used to align ferroelectric liquid crystals (FLC). In fact, the final performance of a surface stabilized FLC (SSFLC) Rat panel display strongly depends on the alignment layer properties and quality. This work focuses on a comparison of two alignment films: the more conventional polyamide, nylon 6, and polytetrafluoroethilene (PTFE, commercially known as Teflon), only recently used as a new aligning material. A micromorphological characterization of the sample surfaces has been carried out in order to correlate structure with alignment properties of both polymer films. The results show varying roughness and periodicity wavelengths for the two alignment layers. These different properties can be related to different anchoring forces between aligning surfaces and FLC molecules and therefore to a different electrooptical response of SSFLC cells. In addition to the topographic characterization, AFM non-conventional measurements have been performed on alignment layers deposited on different transparent conductive oxides, such as indium tin oxide (ITO) and SnO2, used to make electrodes in SSFLC displays. These measurements provide local information onthe adhesive properties of the studied alignment. materials as a function of substrate coating. These observations indicate less adhesion of PTFE with respect to nylon 6.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/09/20 alle ore 02:15:34