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Titolo:
HIGH-RESOLUTION X-RAY-SCATTERING FROM CDMNTE CDTE MULTIPLE-QUANTUM-WELL STRUCTURES/
Autore:
LI CR; TANNER BK; MOCK P; HOGG JHC; LUNN B; ASHENFORD DE;
Indirizzi:
CHINESE ACAD SCI,INST PHYS,POB 603 BEIJING 100080 PEOPLES R CHINA UNIV DURHAM,DEPT PHYS DURHAM DH1 3LE ENGLAND UNIV HULL,DEPT APPL PHYS KINGSTON HULL HU6 7RX N HUMBERSIDE ENGLAND UNIV HULL,DEPT ENGN DESIGN & MANUFACTURE KINGSTON HULL HU6 7RX N HUMBERSIDE ENGLAND
Titolo Testata:
Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics
fascicolo: 2-4, volume: 19, anno: 1997,
pagine: 447 - 454
SICI:
0392-6737(1997)19:2-4<447:HXFCCM>2.0.ZU;2-T
Fonte:
ISI
Lingua:
ENG
Soggetto:
RAMAN-SPECTROSCOPY; INTERFACIAL LAYERS; HETEROSTRUCTURES; SUPERLATTICES; INTERFERENCE; ROUGHNESS; GROWTH; GA2TE3; CDTE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
19
Recensione:
Indirizzi per estratti:
Citazione:
C.R. Li et al., "HIGH-RESOLUTION X-RAY-SCATTERING FROM CDMNTE CDTE MULTIPLE-QUANTUM-WELL STRUCTURES/", Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 447-454

Abstract

Cd1-xMnxTe/CdTe multiple quantum well structures have been investigated by high-resolution X-ray diffraction methods. Reciprocal space mapsof the scattering distribution around the 004 reciprocal point and individual transverse scans showed that the crystalline quality of the epitaxial layers was high. The peak widths, at both the half maximum and one tenth maximum, of transverse scans along the q(x) direction at different q(2) positions, showed no systematic variation with satelliteorder. Analysis of the X-ray diffraction profiles around the 004 reciprocal lattice point indicated the presence of an interfacial phase, of thickness between 0.2 and 0.6 nm for different samples, between the InSb substrate and CdTe buffer layer. This interfacial phase mainly influences the secondary interference fringes and high-angle tails in the diffraction profiles.

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Documento generato il 03/06/20 alle ore 08:58:50