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Titolo:
Electrochemical quartz crystal microbalance study of the electrodepositionmechanisms of Cu2-xSe thin films
Autore:
Kemell, M; Saloniemi, H; Ritala, M; Leskela, M;
Indirizzi:
Univ Helsinki, Dept Chem, Inorgan Chem Lab, FIN-00014 Helsinki, Finland Univ Helsinki Helsinki Finland FIN-00014 ab, FIN-00014 Helsinki, Finland
Titolo Testata:
ELECTROCHIMICA ACTA
fascicolo: 22-23, volume: 45, anno: 2000,
pagine: 3737 - 3748
SICI:
0013-4686(2000)45:22-23<3737:EQCMSO>2.0.ZU;2-#
Fonte:
ISI
Lingua:
ENG
Soggetto:
SCANNING-TUNNELING-MICROSCOPY; GOLD; MICROGRAVIMETRY; THIOCYANATE; TELLURIUM; SELENIUM; AU(100);
Keywords:
copper selenide; thin films; electrodeposition; cyclic voltammetry; electrochemical quartz crystal microbalance;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
25
Recensione:
Indirizzi per estratti:
Indirizzo: Kemell, M Univ Helsinki, Dept Chem, Inorgan Chem Lab, POB 55, FIN-00014 Helsinki, Finland Univ Helsinki POB 55 Helsinki Finland FIN-00014 lsinki, Finland
Citazione:
M. Kemell et al., "Electrochemical quartz crystal microbalance study of the electrodepositionmechanisms of Cu2-xSe thin films", ELECTR ACT, 45(22-23), 2000, pp. 3737-3748

Abstract

Electrodeposition mechanisms of Se, Cu and Cu2-xSe thin films were studiedby means of the electrochemical quartz crystal microbalance (EQCM). The electrodeposition of Se was found to be faster at higher overpotentials, though with lower apparent efficiency. The formation of Cu2-xSe from a thiocyanate bath was confirmed to proceed via the induced co-deposition mechanism at more positive potentials than where Cu+ alone is reduced. The M/z value corresponding to Cu2-xSe formation first decreased gradually during the cyclic voltammogram, indicating that the previously formed Se film was converted into Cu2-xSe. After the Se film was consumed, the M/z value settled to a constant value, which corresponded to the formation of Cu2-xSe from Cu+ andSe4+ ions. The M/z value was constant over a wide potential range. In contrast, when the Cu2-xSe films were deposited at constant potentials, the M/zvalue was found to be dependent on the deposition potential. (C) 2000 Elsevier Science Ltd. All rights reserved.

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Documento generato il 23/09/20 alle ore 05:15:09