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Titolo:
Nanofabrication on hydrogen-terminated diamond surfaces by atomic force microscope probe-induced oxidation
Autore:
Tachiki, M; Fukuda, T; Sugata, K; Seo, H; Umezawa, H; Kawarada, H;
Indirizzi:
Waseda Univ, Sch Sci & Engn, Shinjuku Ku, Tokyo 1690072, Japan Waseda Univ Tokyo Japan 1690072 Engn, Shinjuku Ku, Tokyo 1690072, Japan
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
fascicolo: 7B, volume: 39, anno: 2000,
pagine: 4631 - 4632
SICI:
0021-4922(200007)39:7B<4631:NOHDSB>2.0.ZU;2-4
Fonte:
ISI
Lingua:
ENG
Soggetto:
SILICON; NANOSTRUCTURES; FABRICATION; TRANSISTOR; AIR;
Keywords:
diamond; SPM; AFM; surface conduction; hydrogen termination; electron affinity;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
15
Recensione:
Indirizzi per estratti:
Citazione:
M. Tachiki et al., "Nanofabrication on hydrogen-terminated diamond surfaces by atomic force microscope probe-induced oxidation", JPN J A P 1, 39(7B), 2000, pp. 4631-4632

Abstract

Field-assisted local oxidation on a hydrogen-terminated (001) diamond surface was performed using an atomic force microscope (AFM). Anodic oxidation by a surface water meniscus layer is suggested to account for this oxidation process. Through the oxygenated al ca, Fowler-Nordheim (F-N) tunneling current was observed. The difference in electron affinity between the hydrogen-terminated surface and the oxygenated area was confirmed by scanning electron microscopic (SEM) observations.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 28/03/20 alle ore 13:56:04