Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Experimental results on BIC sensors for transient current testing
Autore:
Picos, R; Roca, M; Isern, E; Segura, J; Garcia-Moreno, E;
Indirizzi:
Univ Balearic Isl, Dept Phys, Palma de Mallorca 07071, Spain Univ BalearicIsl Palma de Mallorca Spain 07071 de Mallorca 07071, Spain
Titolo Testata:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
fascicolo: 3, volume: 16, anno: 2000,
pagine: 235 - 241
SICI:
0923-8174(200006)16:3<235:EROBSF>2.0.ZU;2-0
Fonte:
ISI
Lingua:
ENG
Soggetto:
POWER-SUPPLY CURRENT; FAULT-DETECTION; CIRCUITS; ICS;
Keywords:
transient current testing; i(dd)(t); built-in current sensor; defect detection;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
--discip_EC--
Citazioni:
13
Recensione:
Indirizzi per estratti:
Indirizzo: Picos, R Univ Balearic Isl, Dept Phys, Cra Valldemossa Km 7-5, Palma de Mallorca 07071, Spain Univ Balearic Isl Cra Valldemossa Km 7-5 Palma de Mallorca Spain 07071
Citazione:
R. Picos et al., "Experimental results on BIC sensors for transient current testing", J ELEC TEST, 16(3), 2000, pp. 235-241

Abstract

In this work experimental results on a built-in current sensor for dynamiccurrent testing, i(dd)(t), based on integration concepts are presented. The experimental validation proposed in this work is done through a VLSI CMOScircuit implemented in a 0.7 mu m technology. Different experiences have been developed analyzing the detectability of several kind of defects through this technique. The encouraging results obtained present this technique as an attractive complement to boolean and I-DDQ testing.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/04/20 alle ore 02:28:35