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Titolo: HOLE MOBILITIES AND THE EFFECTIVE HALL FACTOR IN PTYPE GAAS
Autore: WENZEL M; IRMER G; MONECKE J; SIEGEL W;
 Indirizzi:
 FREIBERG UNIV MIN & TECHNOL,INST THEORET PHYS,B V COTTA STR 4 D09596FREIBERG GERMANY FREIBERG UNIV MIN & TECHNOL,INST EXPT PHYS D09596 FREIBERG GERMANY
 Titolo Testata:
 Journal of applied physics
fascicolo: 12,
volume: 81,
anno: 1997,
pagine: 7810  7816
 SICI:
 00218979(1997)81:12<7810:HMATEH>2.0.ZU;2Z
 Fonte:
 ISI
 Lingua:
 ENG
 Soggetto:
 IIIVCOMPOUNDS; LATTICE MOBILITY; ALLOY SCATTERING; DOPED GAAS; SEMICONDUCTORS; TRANSPORT;
 Tipo documento:
 Article
 Natura:
 Periodico
 Settore Disciplinare:
 Science Citation Index Expanded
 Citazioni:
 26
 Recensione:
 Indirizzi per estratti:



 Citazione:
 M. Wenzel et al., "HOLE MOBILITIES AND THE EFFECTIVE HALL FACTOR IN PTYPE GAAS", Journal of applied physics, 81(12), 1997, pp. 78107816
Abstract
We prove the effective Hall factor in pGaAs to be larger than valuesdiscussed in the literature up to now. The scattering rates for the relevant scattering mechanisms in pGaAs have been recalculated after critical testing the existing models. These calculations allow to deduce theoretical drift and theoretical Hall mobilities as functions of temperature which can be compared with measured data. Theoretical Hall factors in the heavy and light hole bands and an effective Hall factor result. The calculated room temperature values of the drift mobility and of the effective Hall factor are 118 cm(2)/V s and 3.6, respectively. The fitted acoustic deformation potential E1=7.9 eV and the fittedoptical coupling constant DK=1.24X10(11) eV/m are close to values published before. It is shown that the measured strong dependence of theHall mobility on the Hall concentration is not mainly caused by scattering by ionized impurities but by the dependence of the effective Hall factor on the hole concentration. (C) 1997 American Institute of Physics.
ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 15/07/20 alle ore 08:49:10