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Titolo:
Multifractal spectra of atomic force microscope images of ZnO film
Autore:
Sun, X; Xiong, G; Fu, ZX; Wu, ZQ;
Indirizzi:
Univ Sci & Technol China, Ctr Fundamental Phys, Hefei 230026, Peoples R China Univ Sci & Technol China Hefei Peoples R China 230026 6, Peoples R China Univ Sci & Technol China, Dept Phys, Hefei 230026, Peoples R China Univ Sci & Technol China Hefei Peoples R China 230026 6, Peoples R China
Titolo Testata:
ACTA PHYSICA SINICA
fascicolo: 5, volume: 49, anno: 2000,
pagine: 854 - 862
SICI:
1000-3290(200005)49:5<854:MSOAFM>2.0.ZU;2-B
Fonte:
ISI
Lingua:
CHI
Soggetto:
SCANNING PROBE MICROSCOPY; FRACTAL SURFACES; ROUGHNESS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Sun, X Univ Sci & Technol China, Ctr Fundamental Phys, Hefei 230026, Peoples R China Univ Sci & Technol China Hefei Peoples R China 230026 les R China
Citazione:
X. Sun et al., "Multifractal spectra of atomic force microscope images of ZnO film", ACT PHY C E, 49(5), 2000, pp. 854-862

Abstract

The surface topographies of Si-substrate and ZnO films as-deposited and annealed were measured by atomic force microscope (AFM). Five methods (variance from average height,absolute deviation from average height, height basedon the minimum height of the rough surface, height based on a depth from the surface, height based on the bottom of the film) for determining height distribution probability are used to calculate the multifractal spectra of AFM images. It is found that the former three methods could not satisfy thescaling law well when the smaller probability subsets provide the main contribution to the partition function. On the other hand,the latter two methods can satisfy the scaling law close to 3 orders of magnitude and can be used to compare roughness between different rough surface quantitatively.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 25/11/20 alle ore 01:31:28