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Titolo:
Electrical double-layer structure at the rutile-water interface as observed in situ with small-period X-ray standing waves
Autore:
Fenter, P; Cheng, L; Rihs, S; Machesky, M; Bedzyk, MJ; Sturchio, NC;
Indirizzi:
Argonne Natl Lab, Argonne, IL 60439 USA Argonne Natl Lab Argonne IL USA 60439 nne Natl Lab, Argonne, IL 60439 USA Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA Northwestern Univ Evanston IL USA 60208 ci & Engn, Evanston, IL 60208 USA Northwestern Univ, Inst Environm Catalysis, Evanston, IL 60208 USA Northwestern Univ Evanston IL USA 60208 Catalysis, Evanston, IL 60208 USA Illinois State Water Survey, Champaign, IL 61820 USA Illinois State Water Survey Champaign IL USA 61820 hampaign, IL 61820 USA
Titolo Testata:
JOURNAL OF COLLOID AND INTERFACE SCIENCE
fascicolo: 1, volume: 225, anno: 2000,
pagine: 154 - 165
SICI:
0021-9797(20000501)225:1<154:EDSATR>2.0.ZU;2-T
Fonte:
ISI
Lingua:
ENG
Soggetto:
METAL-OXIDE SURFACES; INCIDENCE XAFS SPECTROSCOPY; DIFFUSE-DOUBLE-LAYER; COUNTERION DISTRIBUTION; ION ADSORPTION; 250-DEGREES-C; IDENTIFICATION; SCATTERING; MICELLES; SORPTION;
Keywords:
electrical double layer; X-ray standing waves; mineral-fluid interface; rutile; Sr2+ and Rb+ adsorption;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
37
Recensione:
Indirizzi per estratti:
Indirizzo: Fenter, P Argonne Natl Lab, ER-203,9700 S Cass Ave, Argonne, IL 60439 USA Argonne Natl Lab ER-203,9700 S Cass Ave Argonne IL USA 60439 USA
Citazione:
P. Fenter et al., "Electrical double-layer structure at the rutile-water interface as observed in situ with small-period X-ray standing waves", J COLL I SC, 225(1), 2000, pp. 154-165

Abstract

X-Ray standing wave (XSW) measurements were made of Rb and Sr adsorbed from aqueous solutions at the rutile (110)-water interface. These experiments were performed to address the extent to which direct measurements of electrical double-layer structure are possible. The experimental results show that the Bragg XSW technique, using small-period standing waves generated by Bragg diffraction from the substrate, can precisely measure ion locations within the condensed layer and the in situ partitioning of ions between the condensed and diffuse layers. Differences in condensed layer ion positions were observed for Sr ions (measured in situ) as compared with Rb ions (in situ) and also for Sr ions (ex situ). An additional constraint on the ex situSr site geometry was provided by polarization-dependent surface EXAFS measurements. Such measurements can provide important constraints for the development and verification of electrical double-layer theory especially as applied to ion adsorption at the solid-water interface. (C) 2000 Academic Press.

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Documento generato il 10/07/20 alle ore 18:44:07