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Titolo:
Dependence of exchange coupling in permalloy/Cr82Al18 bilayers on the constituent layer thickness
Autore:
Zhou, SM; Liu, K; Chien, CL;
Indirizzi:
Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA Johns Hopkins Univ Baltimore MD USA 21218 Astron, Baltimore, MD 21218 USA
Titolo Testata:
JOURNAL OF APPLIED PHYSICS
fascicolo: 9, volume: 87, anno: 2000,
parte:, 3
pagine: 6659 - 6661
SICI:
0021-8979(20000501)87:9<6659:DOECIP>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Soggetto:
FILMS; ANISOTROPY; BIAS; INTERFACES; MODEL;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
21
Recensione:
Indirizzi per estratti:
Indirizzo: Zhou, SM Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA Johns Hopkins Univ Baltimore MD USA 21218 altimore, MD 21218 USA
Citazione:
S.M. Zhou et al., "Dependence of exchange coupling in permalloy/Cr82Al18 bilayers on the constituent layer thickness", J APPL PHYS, 87(9), 2000, pp. 6659-6661

Abstract

Due to a weaker exchange coupling, the coercivity in permalloy/Cr82Al18 bilayers of thicknesses t(FM) and t(AF), respectively, has been found to varyas 1/t(FM)(3/2) at room temperature, a behavior previously only observed at low temperatures. At room temperature, the exchange field decreases when t(AF) is less than 40 nm and vanishes at 25 nm. Switching in wedged-permalloy/Cr82Al18 bilayers consists of two macroscopic domains with one domain wall moving along the wedge direction. (C) 2000 American Institute of Physics. [S0021-8979(00)69108-9].

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Documento generato il 04/04/20 alle ore 12:16:49