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Titolo:
Characterization of fractal surfaces
Autore:
Wu, JJ;
Indirizzi:
Chinese Cultural Univ, Dept Engn Mech, Taipei, Taiwan Chinese Cultural Univ Taipei Taiwan niv, Dept Engn Mech, Taipei, Taiwan
Titolo Testata:
WEAR
fascicolo: 1, volume: 239, anno: 2000,
pagine: 36 - 47
SICI:
0043-1648(200004)239:1<36:COFS>2.0.ZU;2-R
Fonte:
ISI
Lingua:
ENG
Soggetto:
ROUGH SURFACES; CONTACT; MODEL;
Keywords:
fractal surface; root mean square; asperity;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
16
Recensione:
Indirizzi per estratti:
Indirizzo: Wu, JJ Chinese Cultural Univ, Dept Engn Mech, F4,270,Sec 2 Li Nong Street,Taipei, Taiwan Chinese Cultural Univ F4,270,Sec 2 Li Nong Street Taipei Taiwan n
Citazione:
J.J. Wu, "Characterization of fractal surfaces", WEAR, 239(1), 2000, pp. 36-47

Abstract

Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 03/07/20 alle ore 15:37:00