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Titolo:
DYNAMICAL ELECTRON-DIFFRACTION ANALYSIS OF LATTICE-PARAMETERS, DEBYE-WALLER FACTORS AND ORDER IN TI-AL AND TI-GA ALLOYS
Autore:
ROSSOUW CJ; GIBSON MA; FORWOOD CT;
Indirizzi:
CSIRO,DIV MAT SCI & TECHNOL,PRIVATE BAG 33 CLAYTON VIC 3169 AUSTRALIA
Titolo Testata:
Ultramicroscopy
fascicolo: 3-4, volume: 66, anno: 1996,
pagine: 193 - 209
SICI:
0304-3991(1996)66:3-4<193:DEAOLD>2.0.ZU;2-K
Fonte:
ISI
Lingua:
ENG
Soggetto:
LINE POSITIONS; HOLZ LINES; PATTERNS;
Keywords:
CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); HIGHER ORDER LAUE ZONE (HOLZ) DIFFRACTION; MISCELLANEOUS METHODS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
21
Recensione:
Indirizzi per estratti:
Citazione:
C.J. Rossouw et al., "DYNAMICAL ELECTRON-DIFFRACTION ANALYSIS OF LATTICE-PARAMETERS, DEBYE-WALLER FACTORS AND ORDER IN TI-AL AND TI-GA ALLOYS", Ultramicroscopy, 66(3-4), 1996, pp. 193-209

Abstract

It is shown that higher order Laue zone (HOLZ) measurements under strong zone-axis dynamical diffraction conditions can be used to measure crystal lattice parameters with relatively high precision (similar to 1 in 10(3)). This method is illustrated for gamma-phase Ti-Al and Ti-Ga alloys, and results for Ti-Al are compared with those obtained from X-ray measurements. The relative positions of quantum state excitationrings in the HOLZ beams are used to demonstrate that both TiAl and TiGa are fully ordered, In addition, a novel way is described for the determination of Debye-Waller factors from intensities in the different quantum state rings. This has the particular advantage of enabling independent assessment of Debye-Waller factors for the various atomic species.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 14/07/20 alle ore 19:19:15