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Titolo:
Environmental scanning electron microscopy study of commonly used filters substrates for the active sampling of atmospheric aerosols
Autore:
Micic, M; Markovic, D; Vukelic, N; Radu, A; Milosevic, B; Leblanc, RM;
Indirizzi:
Univ Miami, Dept Chem, Ctr Supramol Sci, Coral Gables, FL 33124 USA Univ Miami Coral Gables FL USA 33124 amol Sci, Coral Gables, FL 33124 USA
Titolo Testata:
FRESENIUS ENVIRONMENTAL BULLETIN
fascicolo: 3-4, volume: 9, anno: 2000,
pagine: 193 - 200
SICI:
1018-4619(200003/04)9:3-4<193:ESEMSO>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
PARTICLES; CLASSIFICATION;
Keywords:
Environmental Scanning Electron Microscopy (ESEM); atmospheric aerosols; atmospheric particulate; PM2.5; active sampling; filters; filter-particle interactions;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Agriculture,Biology & Environmental Sciences
Citazioni:
16
Recensione:
Indirizzi per estratti:
Indirizzo: Micic, M Univ Miami, Dept Chem, Ctr Supramol Sci, 1301 Mem Dr, Coral Gables, FL 33124 USA Univ Miami 1301 Mem Dr Coral Gables FL USA 33124 es, FL 33124 USA
Citazione:
M. Micic et al., "Environmental scanning electron microscopy study of commonly used filters substrates for the active sampling of atmospheric aerosols", FR ENV BULL, 9(3-4), 2000, pp. 193-200

Abstract

Surface topography of different kinds of commonly used atmospheric particulate matter filters has been investigated using the environmental scanning electron microscopic technique (ESEM). This new technique allows us to observe samples under controlled gaseous atmosphere without any prior preparation of the sample, i.e, coating and fixation. Herein we present comparison of topography of the most commonly used atmospheric particulate filters suchas glass, nitrocellulose paper, PVC and Teflon before and after performingactive sampling of atmospheric particulates.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 07/07/20 alle ore 15:44:07