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Titolo:
Ion beam analysis of interface reactions in magnetite and maghemite thin films
Autore:
Thevuthasan, S; McCready, DE; Jiang, W; Yi, SI; Maheswaran, S; Keefer, KD; Chambers, SA;
Indirizzi:
Battelle Mem Inst, Pacific NW Labs, Environm Mol Sci Lab, Richland, WA 99352 USA Battelle Mem Inst Richland WA USA 99352 l Sci Lab, Richland, WA 99352 USA Univ Western Sydney Nepean, Sch Sci, Kingswood, NSW 2747, Australia Univ Western Sydney Nepean Kingswood NSW Australia 2747 W 2747, Australia
Titolo Testata:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
, volume: 161, anno: 2000,
pagine: 510 - 514
SICI:
0168-583X(200003)161:<510:IBAOIR>2.0.ZU;2-Z
Fonte:
ISI
Lingua:
ENG
Soggetto:
EPITAXIAL-FILMS; GROWTH; FE3O4; ALPHA-FE2O3; GAMMA-FE2O3;
Keywords:
ion scattering; Rutherford backscattering spectrometry (RBS); channeling; magnetite (Fe3O4); maghemite (gamma-Fe2O3); magnesioferrite (MgFe2O4); Mg diffusion;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Thevuthasan, S Battelle Mem Inst, Pacific NW Labs, Environm Mol Sci Lab, POB 999,MSIN K2-12, Richland, WA 99352 USA Battelle Mem Inst POB 999,MSIN K2-12 Richland WA USA 99352
Citazione:
S. Thevuthasan et al., "Ion beam analysis of interface reactions in magnetite and maghemite thin films", NUCL INST B, 161, 2000, pp. 510-514

Abstract

We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (gamma-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD), Annealing these films in 2.0x10(-6) Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 Kanneal while the gamma-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O. (C) 2000 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/01/20 alle ore 07:28:04