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Titolo:
Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes
Autore:
Shin, YS; Yoon, TH; Park, JR; Nam, CH;
Indirizzi:
Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea Korea Adv Inst Sci & Technol Taejon South Korea 305701 5701, South Korea Korea Res inst Stand & Sci, Taejon 305600, South Korea Korea Res inst Stand & Sci Taejon South Korea 305600 305600, South Korea
Titolo Testata:
OPTICS COMMUNICATIONS
fascicolo: 1-6, volume: 173, anno: 2000,
pagine: 303 - 309
SICI:
0030-4018(20000101)173:1-6<303:SMFMTL>2.0.ZU;2-F
Fonte:
ISI
Lingua:
ENG
Soggetto:
SEMICONDUCTOR-LASERS; OPTICAL FEEDBACK; FACTOR-ALPHA; AMPLIFIER;
Keywords:
external cavity laser diode; linewidth enhancement factor; compound cavity; external feedback; effective reflectivity; half wave plate;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
--discip_EC--
Citazioni:
21
Recensione:
Indirizzi per estratti:
Indirizzo: Shin, YS Korea Adv Inst Sci & Technol, Dept Phys, 373-1 Yusong, Taejon 305701, South Korea Korea Adv Inst Sci & Technol 373-1 Yusong Taejon South Korea 305701
Citazione:
Y.S. Shin et al., "Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes", OPT COMMUN, 173(1-6), 2000, pp. 303-309

Abstract

We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor(Lu) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with a between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivityis used to determine the value of a in the current scanning method and in the reflectivity scanning method, respectively. The measured values of a: by the two methods showed a fairly good agreement. (C) 2000 Elsevier ScienceB.V. All rights reserved.

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Documento generato il 30/10/20 alle ore 09:23:58