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Titolo:
High-resolution core level photoelectron spectroscopy on InP(110)
Autore:
Esser, N; Frisch, AM; Richter, W; Vogt, P; Braun, W; Follath, R; Jung, C;
Indirizzi:
Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany Tech Univ Berlin Berlin Germany D-10623 perphys, D-10623 Berlin, Germany BESSY GmbH, D-12489 Berlin, Germany BESSY GmbH Berlin Germany D-12489BESSY GmbH, D-12489 Berlin, Germany
Titolo Testata:
SOLID STATE COMMUNICATIONS
fascicolo: 8, volume: 113, anno: 2000,
pagine: 443 - 446
SICI:
0038-1098(2000)113:8<443:HCLPSO>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Soggetto:
FINE-STRUCTURE; SURFACE; SHIFTS; INP;
Keywords:
semiconductors; synchrotron radiation; photoelectron spectroscopies;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Esser, N Tech Univ Berlin, Inst Festkorperphys, Hardenbergstr 36, D-10623 Berlin, Germany Tech Univ Berlin Hardenbergstr 36 Berlin Germany D-10623 Germany
Citazione:
N. Esser et al., "High-resolution core level photoelectron spectroscopy on InP(110)", SOL ST COMM, 113(8), 2000, pp. 443-446

Abstract

We investigate the lineshape of In4d and P2p core level emission spectra recorded with high spectral resolution on cleaved InP(110) surfaces for a wide range of photon energies. A curve fitting analysis with Voigt functions is used to decompose the spectra in surface and bulk core level emission lines. We find that an intrinsic broadening of approximately 250 meV limits the linewidth of the In4d and P2p emission components of both surface and bulk. We attribute the broadening to local band bending variations induced bysurface inhomogeneities such as cleavage steps and atomic defects. Surfacecore level shifts of 320 meV for In4d and 305 meV for P2p are found, in excellent agreement with previously published data. The intensity of the surface components with respect to those of the bulk is found to deviate from the expectation based upon the electron escape depth due to photoelectron diffraction effects. (C) 2000 Elsevier Science Ltd. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/01/21 alle ore 01:01:02