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Titolo:
Critical values of the lenth method for unreplicated factorial designs
Autore:
Ye, KQ; Hamada, M;
Indirizzi:
SUNY Stony Brook, Dept Appl Math & Stat, Stony Brook, NY 11794 USA SUNY Stony Brook Stony Brook NY USA 11794 Stat, Stony Brook, NY 11794 USA Univ Calif Los Alamos Natl Lab, Los Alamos, NM 87545 USA Univ Calif Los Alamos Natl Lab Los Alamos NM USA 87545 amos, NM 87545 USA
Titolo Testata:
JOURNAL OF QUALITY TECHNOLOGY
fascicolo: 1, volume: 32, anno: 2000,
pagine: 57 - 66
SICI:
0022-4065(200001)32:1<57:CVOTLM>2.0.ZU;2-J
Fonte:
ISI
Lingua:
ENG
Keywords:
confidence intervals; experimentwise error rate; individual error rate; factorial designs; fractional factorial designs; mixed-level designs; Plackett-Burman designs; simulation;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
11
Recensione:
Indirizzi per estratti:
Indirizzo: Ye, KQ SUNY Stony Brook, Dept Appl Math & Stat, Stony Brook, NY 11794 USA SUNY Stony Brook Stony Brook NY USA 11794 tony Brook, NY 11794 USA
Citazione:
K.Q. Ye e M. Hamada, "Critical values of the lenth method for unreplicated factorial designs", J QUAL TECH, 32(1), 2000, pp. 57-66

Abstract

The Lenth method is an objective method for testing effects from unreplicated factorial designs and eliminates the subjectivity in using a half-normal plot. The Lenth statistics are computed for the factorial effects and compared to corresponding critical values. Since the distribution of the Lenthstatistics is not mathematically tractable, we propose a simple simulationmethod to estimate the critical values. Confidence intervals for the estimated critical values can also easily be obtained. Tables of critical valuesare provided for a large number of designs, and their use is demonstrated with data from three experiments. The proposed method can also be adapted to estimate critical values for other methods.

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Documento generato il 02/07/20 alle ore 21:06:33