Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Classification of scanning probe microscopies - (Technical report)
Autore:
Friedbacher, G; Fuchs, H;
Indirizzi:
Victoria Univ Technol, Inst Analyt Chem, A-1060 Vienna, Austria Victoria Univ Technol Vienna Austria A-1060 Chem, A-1060 Vienna, Austria Univ Munster, Inst Phys, D-48149 Munster, Germany Univ Munster Munster Germany D-48149 Inst Phys, D-48149 Munster, Germany
Titolo Testata:
PURE AND APPLIED CHEMISTRY
fascicolo: 7, volume: 71, anno: 1999,
pagine: 1337 - 1357
SICI:
0033-4545(199907)71:7<1337:COSPM->2.0.ZU;2-W
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-FORCE MICROSCOPY; FIELD OPTICAL MICROSCOPY; ELECTRON-EMISSION MICROSCOPY; RESOLVED SURFACE-CHEMISTRY; ION-CONDUCTANCE MICROSCOPE; SPIN-POLARIZED ELECTRONS; TUNNELING-MICROSCOPY; TAPPING-MODE; CAPACITANCE MICROSCOPY; EVANESCENT-FIELD;
Tipo documento:
Review
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
118
Recensione:
Indirizzi per estratti:
Indirizzo: Friedbacher, G Victoria Univ Technol, Inst Analyt Chem, Getreidemarkt 9-151, A-1060 Vienna, Austria Victoria Univ Technol Getreidemarkt 9-151 ViennaAustria A-1060
Citazione:
G. Friedbacher e H. Fuchs, "Classification of scanning probe microscopies - (Technical report)", PUR A CHEM, 71(7), 1999, pp. 1337-1357

Abstract

In the last few years scanning probe microscopy techniques have gained significant importance in a variety of different research fields in science and technology. A rapid development, stimulated by the invention of the scanning tunneling microscope in 1981 and still proceeding at a high pace, has brought about a number of new techniques belonging to this group of surface analytical methods. The large potential of scanning probe microscopes is documented by over 1000 publications per year. Due to the fact that a number of different terms and acronyms exist, which are partially used for identical techniques and which are sometimes confusing, this article is aimed at classification and at an overview on the analytically most important techniques with clarification of common terms. Emphasis will be put on analytical evaluation of scanning tunneling and scanning force microscopy, as up to now these techniques have gained the highest importance for analytical applications.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 23/09/20 alle ore 09:34:32