Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Tests of a prototype pixel array detector for microsecond time-resolved X-ray diffraction
Autore:
Rossi, G; Renzi, M; Eikenberry, EF; Tate, MW; Bilderback, D; Fontes, E; Wixted, R; Barna, S; Gruner, SM;
Indirizzi:
Cornell Univ, Dept Phys, Ithaca, NY 14853 USA Cornell Univ Ithaca NY USA 14853 ll Univ, Dept Phys, Ithaca, NY 14853 USA Univ Med & Dent New Jersey, Robert Wood Johnson Med Sch, Dept Pathol, Piscataway, NJ 08854 USA Univ Med & Dent New Jersey Piscataway NJ USA 08854 scataway, NJ 08854 USA Cornell Univ, Cornell High Energy Synchrotron Source, Ithaca, NY 14853 USACornell Univ Ithaca NY USA 14853 Synchrotron Source, Ithaca, NY 14853 USA Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA Cornell Univ Ithaca NY USA 14853 h Appl & Engn Phys, Ithaca, NY 14853 USA Princeton Univ, Dept Phys, Princeton, NJ 08544 USA Princeton Univ Princeton NJ USA 08544 Dept Phys, Princeton, NJ 08544 USA
Titolo Testata:
JOURNAL OF SYNCHROTRON RADIATION
, volume: 6, anno: 1999,
parte:, 6
pagine: 1096 - 1105
SICI:
0909-0495(19991101)6:<1096:TOAPPA>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
CRYSTALLOGRAPHY;
Keywords:
X-ray detectors; area detectors; time-resolved diffraction; Laue diffraction; CMOS imager;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
19
Recensione:
Indirizzi per estratti:
Indirizzo: Rossi, G Cornell Univ, Dept Phys, Ithaca, NY 14853 USA Cornell Univ Ithaca NY USA 14853 Dept Phys, Ithaca, NY 14853 USA
Citazione:
G. Rossi et al., "Tests of a prototype pixel array detector for microsecond time-resolved X-ray diffraction", J SYNCHROTR, 6, 1999, pp. 1096-1105

Abstract

X-ray test results from a prototype 92 x 100 pixel array detector (PAD) for use in rapid time-resolved X-ray diffraction studies are described. This integrating detector is capable of taking up to eight full-frame images at microsecond frame times. It consists of a silicon layer, which absorbs the X-rays, bump-bonded to a layer of CMOS electronics in which each pixel has its own processing, storage and readout electronics. Tests indicate signal performance characteristics are comparable with phosphor-based CCD X-ray detectors, with greatly improved time resolution, comparable linearity and enhanced point spread. This prototype is a test module en rortte to a larger detector suitable for dedicated operation. Areas of needed improvement are discussed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 02/12/20 alle ore 13:44:25