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Titolo:
Electromagnetic calculations of the near field of a tip under polarized laser irradiation
Autore:
Lu, YF; Mai, ZH; Chim, WK;
Indirizzi:
Natl Univ Singapore, Dept Elect Engn, Laser Microproc Lab, Singapore 119260, Singapore Natl Univ Singapore Singapore Singapore 119260 ngapore 119260, Singapore Natl Univ Singapore, Data Storage Inst, Singapore 119260, Singapore Natl Univ Singapore Singapore Singapore 119260 ngapore 119260, Singapore
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
fascicolo: 10, volume: 38, anno: 1999,
pagine: 5910 - 5915
SICI:
0021-4922(199910)38:10<5910:ECOTNF>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Soggetto:
MICROSCOPE TIP; NEAR-FIELD; COMBINATION; FABRICATION;
Keywords:
laser; SPM; near field; nanoscopy; nanoprocessing;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
23
Recensione:
Indirizzi per estratti:
Indirizzo: Lu, YF Natl Univ Singapore, Dept Elect Engn, Laser Microproc Lab, 10 Kent Ridge Crescent, Singapore 119260, Singapore Natl Univ Singapore 10 Kent Ridge Crescent Singapore Singapore 119260
Citazione:
Y.F. Lu et al., "Electromagnetic calculations of the near field of a tip under polarized laser irradiation", JPN J A P 1, 38(10), 1999, pp. 5910-5915

Abstract

A general model of the near field emission for a tip under polarized laserirradiation is established for the case of imaging and processing by a laser-assisted scanning probe microscope (SPM). The near field emission of an actual SPM tip was calculated using the method of moment. The tip-sample geometry was modelled as a cone approaching a surface at the tip apes. Laser-induced current modes in the tip and sample were established in the form oftrigonometric functions. This model can be used for rigorous calculations and has been applied to investigate the dependence of the near field on laser wavelength, tip aspect ratios, tip-sample distance and the dielectric propel ties of both Lip and sample.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/04/20 alle ore 04:07:48