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Titolo:
Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains
Autore:
Cho, YU; Kazuta, S; Matsura, K;
Indirizzi:
Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, JapanTohoku Univ Sendai Miyagi Japan 9808577 Ku, Sendai, Miyagi 9808577, Japan
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
fascicolo: 9B, volume: 38, anno: 1999,
pagine: 5689 - 5694
SICI:
0021-4922(199909)38:9B<5689:SNDMWC>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Soggetto:
POLARIZATION;
Keywords:
scanning nonlinear dielectric microscope; contact sensing mechanism; nanometer-order resolution; ferroelectric materials; domain structure of BaTiO3 single crystal; observation of domain in PbTiO3 thin film;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
10
Recensione:
Indirizzi per estratti:
Indirizzo: Cho, YU Tohoku Univ, Elect Commun Res Inst, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan Tohoku Univ 2-1-1 Katahira Sendai Miyagi Japan 9808577 8577, Japan
Citazione:
Y.U. Cho et al., "Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains", JPN J A P 1, 38(9B), 1999, pp. 5689-5694

Abstract

A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO3 single crystal and in PbTiO3 thin film were observed. By measuring the c-c domain wall of BaTiO3, the microscope was confirmed to have nanometer-order resolution.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/07/20 alle ore 14:15:39