Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Plasma-polymerized hexamethyldisiloxane films characterized by variable-energy positron lifetime spectroscopy
Autore:
Wang, CL; Kobayashi, Y; Togashi, H; Kato, K; Hirotsu, T; Hirata, K; Suzuki, R; Ohdaira, T; Mikado, T;
Indirizzi:
Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058565, Japan Natl Inst Mat & Chem Res Tsukuba Ibaraki Japan 3058565 aki 3058565, Japan Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan Electrotech Lab Tsukuba Ibaraki Japan 3058568 uba, Ibaraki 3058568, Japan
Titolo Testata:
JOURNAL OF APPLIED POLYMER SCIENCE
fascicolo: 10, volume: 74, anno: 1999,
pagine: 2522 - 2528
SICI:
0021-8995(199912)74:10<2522:PHFCBV>2.0.ZU;2-G
Fonte:
ISI
Lingua:
ENG
Soggetto:
HYDROGENATED-AMORPHOUS-SILICON; ELECTRIC-FIELD; PULSING SYSTEM; FREE-VOLUME; BEAM; POLYPROPYLENE; ANNIHILATION; TEMPERATURE; DEPENDENCE; MEMBRANES;
Keywords:
plasma-polymerized film; hexamethyldisiloxane; variable-energy positron lifetime spectroscopy;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
33
Recensione:
Indirizzi per estratti:
Indirizzo: Kobayashi, Y Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058565, Japan Natl Inst Mat & Chem Res Tsukuba Ibaraki Japan 3058565 Japan
Citazione:
C.L. Wang et al., "Plasma-polymerized hexamethyldisiloxane films characterized by variable-energy positron lifetime spectroscopy", J APPL POLY, 74(10), 1999, pp. 2522-2528

Abstract

Nanometer-size holes in plasma-polymerized thin films were characterized by variable-energy positron lifetime spectroscopy for the first time. Hexamethyldisiloxane (HMDSiO) was plasma-polymerized at different discharge powers (30-105 W) and monomer pressures (1.0-4.9 Pa). The positron lifetime spectra of deposited films were collected at positron energies of 1 and 5 keV. All films showed a well-defined long-lived component due to pick-off annihilation of ortho-positronium (o-Ps). The o-Ps lifetime tau(3), reflecting the average size of free-volume holes in the film, increased with an increasing ratio of plasma discharge power, W, and monomer flow rate, F. Based on the empirical relationship between the o-Ps lifetime and the cavity radius, hole volumes were estimated to be 0.19-0.36 nm(3). We also found that the o-Ps intensity, I-3, depends strongly on the same parameter, W/F. Comparisonwith infrared (IR) absorption spectroscopy data showed that Ps formation is suppressed in films with fewer organic bonds and higher disorder, i.e., those increasingly inorganic in nature. (C) 1999 John Wiley & Sons, Ltd.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/04/20 alle ore 03:31:03