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Titolo:
SiON films deposited on Si(111) substrates - new promising materials for nonlinear optics
Autore:
Plucinski, KJ; Makowska-Janusik, M; Mefleh, A; Kityk, IV; Yushanin, VG;
Indirizzi:
Inst Phys WSP, PL-42217 Czestochowa, Poland Inst Phys WSP Czestochowa Poland PL-42217 , PL-42217 Czestochowa, Poland Mil Univ Technol, PL-00908 Warsaw, Poland Mil Univ Technol Warsaw PolandPL-00908 Technol, PL-00908 Warsaw, Poland Univ Perpignan, Lab Phys Appl & Automat, F-66860 Perpignan, France Univ Perpignan Perpignan France F-66860 tomat, F-66860 Perpignan, France Boston Ctr Informat Mat Searching, Boston, MA USA Boston Ctr Informat Mat Searching Boston MA USA earching, Boston, MA USA
Titolo Testata:
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
fascicolo: 2, volume: 64, anno: 1999,
pagine: 88 - 98
SICI:
0921-5107(19990930)64:2<88:SFDOSS>2.0.ZU;2-X
Fonte:
ISI
Lingua:
ENG
Soggetto:
OXYNITRIDE FILMS; SILICON-NITRIDE;
Keywords:
SiON thin films; two-photon absorption; optical second harmonic generation; photoinduced phenomena;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
24
Recensione:
Indirizzi per estratti:
Indirizzo: Kityk, IV Inst Phys WSP, Ul Gombrowicza 1-144, PL-42217 Czestochowa, Poland Inst Phys WSP Ul Gombrowicza 1-144 Czestochowa Poland PL-42217
Citazione:
K.J. Plucinski et al., "SiON films deposited on Si(111) substrates - new promising materials for nonlinear optics", MAT SCI E B, 64(2), 1999, pp. 88-98

Abstract

Experimental measurements of the phototransparency stimulated by the YAG-Nd laser (lambda,= 1.06 mu m) in the SiON films deposited on the Si <111 > crystalline surfaces show essential dependence on the ratio between the nitrogen and oxygen (N/O) content. Dependencies of the phototransparency on thechemical content, delaying time, pressure and temperature demonstrate essential sensitivity to the N/O ratio. All of the data show that the photoinduced changes in the SiON-Si < 111 > are caused by both linear and nonlinear optical response function contributions and can be used for non-destructivediagnostic of the film content and thickness. To understand the physics ofthe observed phenomena, we perform detailed theoretical ab initio molecular dynamic simulations on the ground of the norm-conserving non-local pseudopotential method that give possibility to explain the observed dependenciesand to predict the possible changes of the optical constants in the desired directions. (C) 1999 Elsevier Science S.A. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/07/20 alle ore 01:02:55