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Titolo:
Bi/Sb superlattices grown by molecular beam epitaxy
Autore:
Cho, SL; Kim, Y; DiVenere, A; Wong, GK; Ketterson, JB; Hong, JI;
Indirizzi:
Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA NorthwesternUniv Evanston IL USA 60208 & Astron, Evanston, IL 60208 USA Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA Northwestern Univ Evanston IL USA 60208 ci & Engn, Evanston, IL 60208 USA Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China Hong Kong Univ Sci & Technol Hong Kong Peoples R China Peoples R China Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA Northwestern Univ Evanston IL USA 60208 Comp Engn, Evanston, IL 60208 USA
Titolo Testata:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
fascicolo: 5, volume: 17, anno: 1999,
pagine: 2987 - 2990
SICI:
0734-2101(199909/10)17:5<2987:BSGBMB>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
THERMOELECTRIC-POWER; THIN-FILMS; BI;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
--discip_EC--
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Cho, SL Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA Northwestern Univ Evanston IL USA 60208 n, Evanston, IL 60208 USA
Citazione:
S.L. Cho et al., "Bi/Sb superlattices grown by molecular beam epitaxy", J VAC SCI A, 17(5), 1999, pp. 2987-2990

Abstract

Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy onCdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 Angstrom. Structural properties have been investigated usingin situ reflection high-energy electron diffraction (RHEED), theta - 2 theta x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi)with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM. (C) 1999 American Vacuum Society. [S0734-2101(99)01905-3].

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Documento generato il 30/11/20 alle ore 19:55:24